Quantitative and systematic analysis of bias dependence of spin accumulation voltage in a non-degenerate Si spin valve

Soobeom Lee,Fabien Rortais,Ryo Ohshima,Yuichiro Ando,Shinji Miwa,Yoshishige Suzuki,Hayato Koike,Masashi Shiraishi
DOI: https://doi.org/10.1103/PhysRevB.99.064408
2018-10-16
Abstract:Spin accumulation voltages in a non-degenerate Si spin valve are discussed quantitatively as a function of electric bias current using systematic experiments and model calculations. As an open question in semiconductor spintronics, the origin of the deviation of spin accumulation voltages measured experimentally in a non-degenerate Si spin valve is clarified from that obtained by model calculation using the spin drift diffusion equation including the effect of the spin-dependent interfacial resistance of tunneling barriers. Unlike the case of metallic spin valves, the bias dependence of the resistance-area product for a ferromagnet/MgO/Si interface, resulting in the reappearance of the conductance mismatch, plays a central role to induce the deviation.
Materials Science,Applied Physics
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