Innovative temperature-based texturization process for reducing reflectivity in boron-doped as-cut multi-crystalline silicon wafers

Madhesh Raji,Keerthivasan Thamodharan,Srinivasan Manikkam,Ramasamy Perumalsamy
DOI: https://doi.org/10.1007/s10854-024-12367-0
2024-03-22
Journal of Materials Science Materials in Electronics
Abstract:This research paper presents a comprehensive investigation into the reflectivity reduction of multi-crystalline silicon wafers through the application of two distinct etching conditions: room temperature (Case 1) and controlled temperature (50 °C) (Case 2). In both cases, the etchants employed consist of HF + H 2 O 2 + CH 3 COOH (1:3:2), with varying etching durations of 2, 5, 10, and 15 min. To quantify the reduction in reflectivity, a UV–Vis spectrophotometer was employed. Surface morphology was examined using optical microscopy and scanning electron microscopy. Additionally, X-ray diffraction was utilized to investigate the grain orientation of mc-Si, and Fourier transform infrared spectroscopy was applied to analyse the reduction of oxidation in mc-Si wafer grains before and after chemical etching. The reduction of reflectivity in mc-Si wafers with implications for enhancing their photovoltaic efficiency and overall performance in solar cell applications.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied
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