Abstract:An innovative X-ray imaging sensor with intrinsic digital characteristics is presented. It is based on Chromatic Photon Counting technology. The detector is able to count individually the incident X-ray photons and to separate them according to their energy (two 'color' images per exposure). The energy selection occurs in real time and at radiographic imaging speed (GHz global counting rate). Photon counting, color mode and a very high spatial resolution (more than 10 l.p./mm at MTF50) allow to obtain an optimal ratio between image quality and absorbed dose. The individual block of the imaging system is a two-side buttable semiconductor radiation detector made of a thin pixellated CdTe crystal (the sensor) coupled to a large area VLSI CMOS pixel ASIC. 1, 2, 4, 8 tile units have been built. The 8 tiles unit has 25cm x 2.5cm sensitive area. Results and images obtained from in depth testing of several configurations of the system are presented. The X-Ray imaging system is the technological platform of PIXIRAD Imaging Counters s.r.l., a recently constituted INFN spin-off company.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to develop a new type of X - ray imaging sensor. This sensor is based on Chromatic Photon Counting technology and can achieve high - resolution, low - noise digital imaging, and can separate two "color" images according to the energy of incident X - ray photons in a single exposure. Compared with the traditional integration technology, this method can significantly improve the optimal ratio between image quality and absorbed dose while maintaining a high - speed imaging speed (the global counting rate is as high as the GHz level). In addition, by using the technology that combines a CdTe (cadmium telluride) semiconductor radiation detector with a large - area pixel ASIC (Application - Specific Integrated Circuit), the system can effectively reduce the electronic noise to the quantum level while maintaining high spatial resolution. Specifically, the research aims to: 1. **Improve image quality and reduce absorbed dose**: By adopting Chromatic Photon Counting technology, count X - ray photons one by one and distinguish their energies, thereby reducing the radiation dose received by patients while ensuring image quality. 2. **Achieve high spatial resolution**: Utilizing the high - resolution characteristics of the CdTe sensor, the system can reach a spatial resolution of more than 10 line pairs/mm. 3. **Achieve real - time multicolor imaging**: Be able to obtain images at multiple different energy levels in one exposure, increasing the information content of the images. 4. **Expand the application range**: This technology is not only applicable to medical imaging, but can also be widely used in biology, industry, scientific research and other fields, especially in applications requiring high - precision and low - dose imaging. In summary, the core problem of this paper is to explore and develop a new type of X - ray imaging technology to overcome the limitations of existing technologies in terms of image quality, dose control, and multi - energy - spectrum imaging capabilities.

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