X-ray imaging using a hybrid photon counting GaAs pixel detector

C. Schwarz,M. Campbell,R. Goeppert,E.H.M. Heijne,J. Ludwig,G. Meddeler,B. Mikulec,E. Pernigotti,M. Rogalla,K. Runge,A. Söldner-Rembold,K.M. Smith,W. Snoeys,J. Watt
DOI: https://doi.org/10.1016/s0920-5632(99)00592-7
1999-08-01
Abstract:The performance of hybrid GaAs pixel detectors as X-ray imaging sensors were investigated at room temperature. These hybrids consist of 300 μm thick GaAs pixel detectors, flip-chip bonded to a CMOS Single Photon Counting Chip (PCC). This chip consists of a matrix of 64 × 64 identical square pixels (170 μm × 170 μm) and covers a total area of 1.2 cm2. The electronics in each cell comprises a preamplifier, a discriminator with a 3-bit threshold adjust and a 15-bit counter. The detector is realized by an array of Schottky diodes processed on semi-insulating LEC-GaAs bulk material. An IV-characteristic and a detector bias voltage scan showed that the detector can be operated with voltages around 200 V. Images of various objects were taken by using a standard X-ray tube for dental diagnostics. The signal to noise ratio (SNR) was also determined.The applications of these imaging systems range from medical applications like digital mammography or dental X-ray diagnostics to non destructive material testing (NDT). Because of the separation of detector and readout chip, different materials can be investigated and compared.
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