3D integration proceeds tier-by-tier

Matthew Parker
DOI: https://doi.org/10.1038/s41928-024-01204-1
IF: 33.255
2024-06-20
Nature Electronics
Abstract:Yuan Liu and colleagues at Hunan University now report a one-step van der Waals integration method for the monolithic 3D integration of 2D materials. In their approach, all the components of the circuit tier are fabricated on a sacrificial wafer. This includes chemical vapour deposition-grown MoS 2 , the drain and gate electrodes, the gate dielectric (10-nm-thick Al 2 O 3 ) and inter-tier dielectric, and vias. The prefabricated circuit is then removed from the sacrificial wafer and mechanically laminated onto the target 2D surface at a temperature of 120 °C. The researchers demonstrate the transfer of 2-inch circuit tiers, and stacks of up to 10 tiers thick do not show any apparent degradation of the performance of the MoS 2 transistors in the bottom layers. The alignment of the circuit tiers is achieved by using a transparent polydimethylsiloxane stamp and an optical microscope, with an alignment resolution of about 0.5 μm. However, Liu and colleagues argue that similar alignment processes used in photolithography could be adapted to improve this alignment resolution.
engineering, electrical & electronic
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