Micromechanical electrometry of single-electron transistor island charge

M.P. Blencowe,Y. Zhang
DOI: https://doi.org/10.1016/S0921-4526%2802%2900529-X
2001-09-12
Abstract:We consider the possibility of using a micromechanical gate electrode located just above the island of a single-electron transistor to measure directly the fluctuating island charge due to tunnelling electrons.
Mesoscale and Nanoscale Physics,Quantum Physics
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