X-ray diffraction and spectroscopic techniques from liquid surfaces and interfaces

Dvaid Vaknin

DOI: https://doi.org/10.1002/0471266965.com077.pub2

2019-06-23

Abstract:X-ray reflectivity and grazing incidence diffraction (XGID) from liquid surfaces are described.

Soft Condensed Matter

What problem does this paper attempt to address?

Structure of liquid–vapor interfaces: Perspectives from liquid state theory, large-scale simulations, and potential grazing-incidence x-ray diffraction

F. Höfling,S. Dietrich

DOI: https://doi.org/10.1063/5.0186955

IF: 4.304

2024-03-12

The Journal of Chemical Physics

Abstract:Grazing-incidence x-ray diffraction (GIXRD) is a scattering technique that allows one to characterize the structure of fluid interfaces down to the molecular scale, including the measurement of surface tension and interface roughness. However, the corresponding standard data analysis at nonzero wave numbers has been criticized as to be inconclusive because the scattering intensity is polluted by the unavoidable scattering from the bulk. Here, we overcome this ambiguity by proposing a physically consistent model of the bulk contribution based on a minimal set of assumptions of experimental relevance. To this end, we derive an explicit integral expression for the background scattering, which can be determined numerically from the static structure factors of the coexisting bulk phases as independent input. Concerning the interpretation of GIXRD data inferred from computer simulations, we extend the model to account also for the finite sizes of the bulk phases, which are unavoidable in simulations. The corresponding leading-order correction beyond the dominant contribution to the scattered intensity is revealed by asymptotic analysis, which is characterized by the competition between the linear system size and the x-ray penetration depth in the case of simulations. Specifically, we have calculated the expected GIXRD intensity for scattering at the planar liquid–vapor interface of Lennard-Jones fluids with truncated pair interactions via extensive, high-precision computer simulations. The reported data cover interfacial and bulk properties of fluid states along the whole liquid–vapor coexistence line. A sensitivity analysis shows that our findings are robust with respect to the detailed definition of the mean interface position. We conclude that previous claims of an enhanced surface tension at mesoscopic scales are amenable to unambiguous tests via scattering experiments.

chemistry, physical,physics, atomic, molecular & chemical
Structure of liquid--vapor interfaces: perspectives from liquid state theory, large-scale simulations, and potential grazing-incidence X-ray diffraction

Felix Höfling,Siegfried Dietrich

DOI: https://doi.org/10.1063/5.0186955

2024-02-10

Abstract:Grazing-incidence X-ray diffraction (GIXRD) is a scattering technique which allows one to characterize the structure of fluid interfaces down to the molecular scale, including the measurement of the surface tension and of the interface roughness. However, the corresponding standard data analysis at non-zero wave numbers has been criticized as to be inconclusive because the scattering intensity is polluted by the unavoidable scattering from the bulk. Here we overcome this ambiguity by proposing a physically consistent model of the bulk contribution which is based on a minimal set of assumptions of experimental relevance. To this end, we derive an explicit integral expression for the background scattering, which can be determined numerically from the static structure factors of the coexisting bulk phases as independent input. Concerning the interpretation of GIXRD data inferred from computer simulations, we account also for the finite sizes of the bulk phases, which are unavoidable in simulations. The corresponding leading-order correction beyond the dominant contribution to the scattered intensity is revealed by asymptotic analysis, which is characterized by the competition between the linear system size and the X-ray penetration depth in the case of simulations. Specifically, we have calculated the expected GIXRD intensity for scattering at the planar liquid--vapor interface of Lennard-Jones fluids with truncated pair interactions via extensive, high-precision simulations. The reported data cover interfacial and bulk properties of fluid states along the whole liquid--vapor coexistence line. A sensitivity analysis demonstrates the robustness of our findings concerning the detailed definition of the mean interface position. We conclude that previous claims of an enhanced surface tension at mesoscopic scales are amenable to unambiguous tests via scattering experiments.

Soft Condensed Matter,Statistical Mechanics,Chemical Physics
Investigating liquid surfaces down to the nanometer scale using grazing incidence x-ray scattering

C. Fradin,A. Braslau,D. Luzet,M. Alba,C. Gourier,J. Daillant,G. Gruebel,G. Vignaud,J.-F. Legrand,J. Lal J.-M. Petit,F. Rieutord

DOI: https://doi.org/10.1016/S0921-4526%2898%2900255-5

1997-08-23

Abstract:Grazing incidence x-ray surface scattering has been used to investigate liquid surfaces down to the molecular scale. The free surface of water is well described by the capillary wave model (<z(q)z(-q)> ~ q-2 spectrum) up to wavevectors > 10^8 m^-1. At larger wavevectors near-surface acoustic waves must be taken into account. When the interface is bounded by a surfactant monolayer, it exhibits a bending stiffness and the bending rigidity modulus can be measured. However, bending effects generally cannot be described using the Helfrich Hamiltonian and the characteristic exponent in the roughness power spectrum can smaller than 4. Finally, upon compression, tethered monolayers formed on a subphase containing divalent ions are shown to buckle in the third dimension with a characteristic wavelength on the order of 10^8 m^-1.

Soft Condensed Matter
Recent progress in application of surface X-ray scattering techniques to soft interfacial films

Takanori Takiue,Makoto Aratono

DOI: https://doi.org/10.1016/j.cis.2024.103108

IF: 15.19

2024-02-10

Advances in Colloid and Interface Science

Abstract:X-ray reflection (XR) and surface grazing incidence X-ray diffraction GIXD) techniques have traditionally been used to evaluate the structure of soft interfacial films. In recent years, the use of synchrotron radiation and two-dimensional detectors has enabled high resolution and high speed measurements of interfacial films, which makes it possible to evaluate more detailed and complex interfacial film structures and adsorption dynamics. In this review, we will provide an overview of recent progress in structural characterization of simple oil/water interfaces, interfacial films of biologically relevant materials, oil/water interfaces for extraction of rare metal ions, and adsorption of nanoparticles. Examples of the application of time-resolved XR methods and surface sensitive techniques such as GISAXS and surface X-ray fluorescence analysis will also be presented.

chemistry, physical
Thin-Film Characterization by Grazing Incidence X-Ray Diffraction and Multiple Beam Interference

SL Chang

DOI: https://doi.org/10.1016/s0022-3697(01)00109-3

IF: 4.383

2001-01-01

Journal of Physics and Chemistry of Solids

Abstract:An overview is given of the application of two-beam and multiple-beam approach to grazing incidence X-ray diffraction (GIXD) for single-crystal thin film characterization. Crystallographic orientation, lattice mismatch, order parameter, and phase of in-plane reflection for various thin film systems are determined by using conventional two-beam GIXD and resonance three-beam GIXD. The diffraction technique, analysis procedure, and theoretical consideration are also presented and discussed.
Reflection of X-Rays from A Rough Surface at Extremely Small Grazing Angles

Mingwu Wen,Igor V. Kozhevnikov,Zhanshan Wang

DOI: https://doi.org/10.1364/oe.23.024220

IF: 3.8

2015-01-01

Optics Express

Abstract:Peculiarities of X-ray diffraction from a rough surface at an extremely small grazing angle of an incident beam are theoretically studied. The interrelation of four diffraction channels (coherent reflectance, coherent transmittance, diffuse scattering in vacuum, and scattering into the matter depth) is analyzed for different limiting cases (large and small correlation length of roughness and large and extremely small grazing angle of incident radiation). Both the Debye-Waller and the Nevot-Croce factors are demonstrated to describe improperly the features of X-ray diffraction at extremely small grazing angles. More appropriate simple analytic expressions for the specular reflectivity and total integrated scattering in vacuum are obtained instead. Transformation of one limiting diffraction regime into another one with variation in the correlation length of roughness is discussed.
X-Ray Diffraction: Instrumentation and Applications

Andrei A. Bunaciu,Elena gabriela Udriştioiu,Hassan Y. Aboul-Enein

DOI: https://doi.org/10.1080/10408347.2014.949616

2015-04-01

Critical Reviews in Analytical Chemistry

Abstract:X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the X-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. This review summarizes the scientific trends associated with the rapid development of the technique of X-ray diffraction over the past five years pertaining to the fields of pharmaceuticals, forensic science, geological applications, microelectronics, and glass manufacturing, as well as in corrosion analysis.

chemistry, analytical
X-ray Surface Scattering Studies of Molecular Ordering at Liquid-Liquid Interfaces

Schlossman Mark L.,Li Ming,Mitrinovic Dragoslav M.,Tikhonov Aleksey M.

DOI: https://doi.org/10.1557/proc-590-165

2006-01-01

Abstract:We present our recent progress in using synchrotron x-ray surface scattering techniques to study several different aspects of ordering at liquid-liquid interfaces. (1) We present measurements of the interfacial width at the water-alkane interface for a series of different chain length alkanes. The width for the shortest chain length studied is in agreement with capillary wave theory. However, significant deviations occur for longer chain lengths, indicating the presence of molecular ordering at the interface. (2) Under appropriate conditions, a surfactant monolayer forms at the interface between water and a hexane solution of a fluorinated surfactant. Reflectivity measurements that probe the electron density profile normal to the interface provide information about the surfactant ordering. This monolayer undergoes a solid to gas transition as a function of temperature. Diffuse scattering near the transition reveals the presence of islands. (3) Equilibrium interfaces between two aqueous phases containing PEG (polyethylene glycol) and potassium phosphate salts can be studied. We present studies of coherent capillary wave fluctuations between two interfaces of a thin film of this biphase system. We also demonstrate that biological macromolecules can be trapped and studied at this aqueous-aqueous interface.
Reflection Surface X-Ray Diffraction Patterns: K-Space Images

H Hong,Z Wu,TC Chiang,P Zschack,P Jemian,H Chen,RD Aburano

DOI: https://doi.org/10.1063/1.1305512

2000-01-01

Abstract:For the past two decades, x-ray diffraction has been utilized for surface structural determination. Unlike reflection high-energy electron diffraction (RHEED) which is a complicated dynamical scattering process, x-ray surface analysis is simple and straightforward due to the kinematic nature of x rays. Using high brilliance x rays from an undulator beamline and a highly sensitive charge coupled device detector, we successfully observed RHEED-like x-ray diffraction patterns. The patterns were recorded during the preparation of Si(111)-(7×7), transformation to Ge/Si(111)-(5×5) and Ge growth. Also, simultaneous measurements of x-ray reflectivity and crystal truncation rods are shown feasible with this technique.
Time-resolved Ellipsometry for Studies of Heat Transfer at Liquid/solid and Gas/solid Interfaces.

Chang-Ki Min,David G. Cahill,Steve Granick

DOI: https://doi.org/10.1063/1.3465329

2010-01-01

Abstract:We describe a sensitive method for measuring time-dependent changes in refractive index within approximately 5 microm of an interface using off-null time-resolved ellipsometry and a dual-cavity femtosecond laser. The sensitivity to changes in refractive index is two orders of magnitude higher than conventional picosecond interferometry. A thin metal film on a sapphire substrate is heated by approximately 10 K using an ultrafast optical pump pulse; the subsequent changes of the phase difference deltaDelta between p and s polarized reflectivity are tracked using off-null ellipsometry using a time-delayed probe pulse. We demonstrate a sensitivity of deltaDelta approximately = 3x10(-7) deg/square root(Hz) using interfaces between Au and water, and Au and various gases including R134a, a common refrigerant. Our data for the damping rate of approximately 200 MHz frequency acoustic waves in O(2), N(2), and Ar at atmospheric pressure agree well with prior results obtained at much lower pressures and frequencies.
Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

SL Chang,YS Huang,CH Chao,MT Tang,YP Stetsko

DOI: https://doi.org/10.1103/physrevlett.80.301

IF: 8.6

1998-01-01

Physical Review Letters

Abstract:Three-wave resonance grazing incidence x-ray diffraction is realized for the first time by tuning the x-ray photon energy to match the incident wave vector with the coplanar momentum transfers of crystal surface in-plane reflections. Near the resonance energy, the observed specularly diffracted intensities decreasing at lower energies and increasing at higher energies or vice versa reveal the effects of reflection phases due to the coherent interaction of x-ray surface waves. This experiment thus provides a new way of direct phase determination for surface in-plane reflections.
Tripling of the scattering vector range of X‐ray reflectivity on liquid surfaces using a double‐crystal deflector

Oleg Konovalov,Valentina Rein,Mehdi Saedi,Irene M. N. Groot,Gilles Renaud,Maciej Jankowski

DOI: https://doi.org/10.1107/s1600576724000657

IF: 4.868

2024-02-18

Journal of Applied Crystallography

Abstract:A straightforward method is presented for aligning a double‐crystal deflector for X‐ray diffraction measurements on liquid surfaces. This method allows the measurement of liquid surfaces and interfaces in a high qz range not achievable up to now.The maximum range of perpendicular momentum transfer (qz) has been tripled for X‐ray scattering from liquid surfaces when using a double‐crystal deflector setup to tilt the incident X‐ray beam. This is achieved by employing a higher‐energy X‐ray beam to access Miller indices of reflecting crystal atomic planes that are three times higher than usual. The deviation from the exact Bragg angle condition induced by misalignment between the X‐ray beam axis and the main rotation axis of the double‐crystal deflector is calculated, and a fast and straightforward procedure to align them is deduced. An experimental method of measuring scattering intensity along the qz direction on liquid surfaces up to qz = 7 Å−1 is presented, with liquid copper serving as a reference system for benchmarking purposes.

chemistry, multidisciplinary,crystallography
Monitoring growth with X-ray diffraction

DOI: https://doi.org/10.1098/rsta.1993.0108

1993-09-15

Abstract:With the introduction of high intensity synchrotron radiation sources, X-ray diffraction has become established as a powerful probe of surface crystallography. Many surface structures have been solved with progressively larger unit meshes. More recently, the technique has been extended to provide real time monitoring of surfaces during epitaxial growth. The weak scattering of X-rays allows a simple interpretation of measured intensities through the kinematic approximation, thus giving a direct and immediate insight into the atomic geometry. The technique is not limited to the solid-vacuum interface and has potentially wide application. Thus it may be used to monitor the growth in a OMVPE reaction chamber and can probe atomic arrangements at buried interfaces such as a delta doping layer. The use of X-ray scattering for the study of epitaxial growth on semiconductor surfaces is reviewed with examples taken from recent work.
Time-resolved reflection surface x-ray diffraction

hawoong hong,zhongbiao wu,t c chiang,p zschack,haydn chen

DOI: https://doi.org/10.1063/1.1435823

IF: 1.6

2002-01-01

Review of Scientific Instruments

Abstract:Methods to collect two-dimensional time-resolved x-ray diffraction patterns from surfaces/interfaces were developed. Reflection surface x-ray diffraction utilizing high brilliance x rays and a charge coupled device can achieve a time resolution as good as one second. Also, two-dimensional maps of reflectivity rocking curves can be recorded fast enough to monitor growth processes. These methods were demonstrated for the study of Ag and Pb films on Si (111)-(7x7) surfaces. (C) 2002 American Institute of Physics.
X-ray Scattering from Spintronic Structures

Brian K. Tanner

DOI: https://doi.org/10.1007/978-94-007-6892-5_33

2016-01-01

Abstract:The principles and underlying physics of grazing-incidence X-ray scattering are outlined in the context of application to the study of room temperature spintronic systems. Examples are presented showing the precision and reliability of analysis. The use of diffuse scatter measurements to separate topological roughness from chemical intermixing at interfaces is described. Extension of the physics to soft X-ray reflectivity under both linear and circularly polarized beams is discussed and the link to high-resolution X-ray diffraction of single crystal spintronic structures highlighted.
X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Howie Joress,Shane Quinlan Arlington,Timothy P. Weihs,Joel D. Brock,Arthur Woll

DOI: https://doi.org/10.1063/1.5085063

2018-12-11

Abstract:We have developed an improved method of time-resolved x-ray reflectivity (XRR) using monochromatic synchrotron radiation. Our method utilizes a polycapillary x-ray optic to create a range of incident angles and an area detector to collect the specular reflections. By rotating the sample normal out of the plane of the incident fan, we can separate the surface diffuse scatter from the reflectivity signal, greatly improving the quality of the XRR spectra compared to previous implementations. We demonstrate the time-resolved capabilities of this system, with temporal resolution as low as 10 ms, by measuring XRR during the annealing of Al/Ni nano-scale multilayers and use this information to extract the activation energy for interdiffusion in this system.

Materials Science
Operando X-ray characterization of interfacial charge transfer and structural rearrangements

Reshma R. Rao,Iris C. G. van den Bosch,Christoph Baeumer

DOI: https://doi.org/10.48550/arXiv.2212.04961

2022-12-10

Abstract:Key technologies in energy conversion and storage, sensing and chemical synthesis rely on a detailed knowledge about charge transfer processes at electrified solid-liquid interfaces. However, these interfaces continuously evolve as a function of applied potentials, ionic concentrations and time. We therefore need to characterize chemical composition, atomic arrangement and electronic structure of both the liquid and the solid side of the interface under operating conditions. In this chapter, we discuss the state-of-the-art X-ray based spectroscopy and diffraction approaches for such 'operando' characterization. We highlight recent examples from literature and demonstrate how X-ray absorption spectroscopy, X-ray photoelectron spectroscopy and surface X-ray diffraction can reveal the required interface-sensitive information.

Materials Science
Prospects for the Use of Laboratory Sources for X-ray Reflectometry of Thin Films on a Liquid Surface

Viktor E. Asadchikov,Yuri O. Volkov,Alexander D. Nuzhdin,Boris S. Roshchin,Aleksey M. Tikhonov

DOI: https://doi.org/10.48550/arXiv.2004.07164

2020-04-15

Abstract:The authors present a review of the systematic studies of the structure of macroscopically planar thin films at the air-liquid interface (water, alkali solution and silica hydrosol). A common feature of the considered works is the application of a model-independent approach to the analysis of X-ray reflectometry data, which does not require a priori assumptions about the structure of the object under study. It is shown that the experimental results obtained with the laboratory source in some cases are qualitatively on par with the results of those obtained with the use of synchrotron radiation source. The reproducibility of the effect of spontaneous ordering in films of amphiphilic organic molecules (phospholipids) at the surface of the colloidal solution of silica nanoparticles is demonstrated. The possibility of influencing the kinetics of the in situ formation of a phospholipid film by enriching the liquid substrate with alkali metal ions is also discussed.

Soft Condensed Matter
X-ray scattering methods for films and multilayers and their applications

ZHANG Ai-Mei,WU Xiao-Shan

2007-01-01

Physics

Abstract:Several X-ray diffraction/scattering techniques, including grazing incident X-ray reflectivity, transverse X-ray diffuse scattering, grazing incident X-ray diffraction and X-ray small-angle diffraction, for the characterization of films and multilayers are described. Three examples are given to show the application of these methods.
Some Experimental Aspects of Small and Wide Angle X-Ray-Scattering Studies of Transitions in Polymers and Liquid-Crystals

G UNGAR

DOI: https://doi.org/10.1080/01411599208203483

1992-01-01

Phase Transitions

Abstract:Instrumentation for x-ray diffraction studies of phase behaviour of polymers and liquid crystals is reviewed. Sample environment cells and the choice of cameras and detectors are discussed. In addition, selected examples are briefly described, particularly of polymer investigations using the simultaneous diffraction/calorimetry (XDDSC) technique.

X-ray diffraction and spectroscopic techniques from liquid surfaces and interfaces

Structure of liquid–vapor interfaces: Perspectives from liquid state theory, large-scale simulations, and potential grazing-incidence x-ray diffraction

Structure of liquid--vapor interfaces: perspectives from liquid state theory, large-scale simulations, and potential grazing-incidence X-ray diffraction

Investigating liquid surfaces down to the nanometer scale using grazing incidence x-ray scattering

Recent progress in application of surface X-ray scattering techniques to soft interfacial films

Thin-Film Characterization by Grazing Incidence X-Ray Diffraction and Multiple Beam Interference

Reflection of X-Rays from A Rough Surface at Extremely Small Grazing Angles

X-Ray Diffraction: Instrumentation and Applications

X-ray Surface Scattering Studies of Molecular Ordering at Liquid-Liquid Interfaces

Reflection Surface X-Ray Diffraction Patterns: K-Space Images

Time-resolved Ellipsometry for Studies of Heat Transfer at Liquid/solid and Gas/solid Interfaces.

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Tripling of the scattering vector range of X‐ray reflectivity on liquid surfaces using a double‐crystal deflector

Monitoring growth with X-ray diffraction

Time-resolved reflection surface x-ray diffraction

X-ray Scattering from Spintronic Structures

X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Operando X-ray characterization of interfacial charge transfer and structural rearrangements

Prospects for the Use of Laboratory Sources for X-ray Reflectometry of Thin Films on a Liquid Surface

X-ray scattering methods for films and multilayers and their applications

Some Experimental Aspects of Small and Wide Angle X-Ray-Scattering Studies of Transitions in Polymers and Liquid-Crystals