Abstract:The information content of crystalline materials becomes astronomical when collective electronic behavior and their fluctuations are taken into account. In the past decade, improvements in source brightness and detector technology at modern X-ray facilities have allowed a dramatically increased fraction of this information to be captured. Now, the primary challenge is to understand and discover scientific principles from big datasets when a comprehensive analysis is beyond human reach. We report the development of an unsupervised machine learning approach, X-ray diffraction (XRD) temperature clustering (X-TEC), that can automatically extract charge density wave order parameters and detect intraunit cell ordering and its fluctuations from a series of high-volume X-ray diffraction measurements taken at multiple temperatures. We benchmark X-TEC with diffraction data on a quasi-skutterudite family of materials, (Ca x Sr 1 − x ) 3 Rh 4 Sn 13 , where a quantum critical point is observed as a function of Ca concentration. We apply X-TEC to XRD data on the pyrochlore metal, Cd 2 Re 2 O 7 , to investigate its two much-debated structural phase transitions and uncover the Goldstone mode accompanying them. We demonstrate how unprecedented atomic-scale knowledge can be gained when human researchers connect the X-TEC results to physical principles. Specifically, we extract from the X-TEC–revealed selection rules that the Cd and Re displacements are approximately equal in amplitude but out of phase. This discovery reveals a previously unknown involvement of 5 d 2 Re, supporting the idea of an electronic origin to the structural order. Our approach can radically transform XRD experiments by allowing in operando data analysis and enabling researchers to refine experiments by discovering interesting regions of phase space on the fly.

X-ray Scattering from Spintronic Structures

Grazing-incidence Small Angle X-Ray Scattering Studies of Nanoscale Polymer Gratings

X-Ray Scattering Technologies of Microstructure Analysis of Thin Films

Electronic properties of crystalline materials observed in X-ray diffraction

Diffuse Scattering from Correlated Electron Systems

Correlated Diffuse X-ray Scattering from Periodically Nano-Structured Surfaces

Imaging nonequilibrium atomic vibrations with x-ray diffuse scattering

Microscopic Structure Analysis in Disordered Materials using Anomalous X-ray Scattering

Application of laboratory micro X-ray fluorescence devices for X-ray topography

Magnetic scattering with spin-momentum locking: Single scatterers and diffraction grating

X-ray Small-Angle Scattering in the Study of the Structure of Disordered Nanosystems

Diffuse X-Ray scattering from molecular crystals

X-ray scattering from surfaces: discrete and continuous components of roughness

Harnessing interpretable and unsupervised machine learning to address big data from modern X-ray diffraction

X-ray scattering methods for films and multilayers and their applications

Synchrotron-based high-energy X-ray diffraction and microdiffraction investigations on the mechanical heterogeneity of heterostructured metals

X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

Basic Principles of the Interaction of X-Rays with Matter: Quantum Electrodynamical Analysis

Simultaneous ambient pressure x-ray photoelectron spectroscopy and grazing incidence x-ray scattering in gas environments

Probing Spin-Flip Scattering in Ballistic Nanosystems