Tripling of the scattering vector range of X‐ray reflectivity on liquid surfaces using a double‐crystal deflector

Oleg Konovalov,Valentina Rein,Mehdi Saedi,Irene M. N. Groot,Gilles Renaud,Maciej Jankowski
DOI: https://doi.org/10.1107/s1600576724000657
IF: 4.868
2024-02-18
Journal of Applied Crystallography
Abstract:A straightforward method is presented for aligning a double‐crystal deflector for X‐ray diffraction measurements on liquid surfaces. This method allows the measurement of liquid surfaces and interfaces in a high qz range not achievable up to now.The maximum range of perpendicular momentum transfer (qz) has been tripled for X‐ray scattering from liquid surfaces when using a double‐crystal deflector setup to tilt the incident X‐ray beam. This is achieved by employing a higher‐energy X‐ray beam to access Miller indices of reflecting crystal atomic planes that are three times higher than usual. The deviation from the exact Bragg angle condition induced by misalignment between the X‐ray beam axis and the main rotation axis of the double‐crystal deflector is calculated, and a fast and straightforward procedure to align them is deduced. An experimental method of measuring scattering intensity along the qz direction on liquid surfaces up to qz = 7 Å−1 is presented, with liquid copper serving as a reference system for benchmarking purposes.
chemistry, multidisciplinary,crystallography
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