Abstract:Transparent materials are widely used in industrial applications, such as construction, transportation, and optics. However, the complex optical properties of these materials make it difficult to achieve precise surface form measurements, especially for bulk surface form inspection in industrial environments. Traditional structured light-based measurement methods often struggle with suboptimal signal-to-noise ratios, making them ineffective. Currently, there is a lack of efficient techniques for real-time inspection of such components. This paper proposes a single-frame measurement technique based on deflectometry for large-size transparent surfaces. It utilizes the reflective characteristics of the measured surface, making it independent of the surface's diffuse reflection properties. This fundamentally solves the issues associated with signal-to-noise ratios. By discretizing the phase map, it separates the multiple surface reflection characteristics of transparent devices, enabling transparent device measurement. To meet the requirements of industrial dynamic measurement, this technique only needs a simple and low-cost system structure, which contains just two cameras for image capture. It does not require phase shifting to complete the measurement, making it independent of the screen and having the potential for larger surface measurement. The proposed method was used to measure a 400mm aperture automobile glass, and the results showed that it is able to achieve a measurement accuracy on the order of 10 μ m. The method proposed in this paper overcomes the influence of surface reflection on transparent objects and significantly improves the efficiency and accuracy of large-sized transparent surface measurements by using a single-frame image measurement. Moreover, this method shows promise for broader applications, including measurements of lenses and HUD (Heads-Up Display) components, showcasing significant potential for industrial applications.

Simultaneous Measurement of Double Surfaces of Transparent Lenses with Phase Measuring Deflectometry

Research on Two Optical Methods for Aspheric Measurement

Interferometry Measurement Of Parallel Optical Plate Wavefront

Surface Measurement Methods Based on Single and Multi-Frequency Fringes and Its Applications in Reverse Engineering

Selection of Phase-Recovery Algorithms for Fringe Processing in Optical Measurement of Micro-Surface

Optimization of Transverse Translation Diverse Phase Retrieval for Optical Elements with Mid-Spatial Frequency Errors

Adaptive Phase Correction For Phase Measuring Deflectometry Based On Light Field Modulation

Transition imaging phase measuring deflectometry for high-precision measurement of optical surfaces

A Single-Frame Deflectometry Method for Online Inspection of Light-Transmitting Components

In-situ Deflectometic Measurement of Transparent Optics in Precision Robotic Polishing

Wavefront-coded phase measuring deflectometry for the all-focused measurement

Collimated Phase Measuring Deflectometry

Self-calibration of in Situ Monoscopic Deflectometric Measurement in Precision Optical Manufacturing.

Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces.

Phase calculation of smooth surface with multi-reflectivity based on phase measurement deflectometry.

Correction of Aberration-Induced Phase Errors in Phase Measuring Deflectometry

Dynamic Three-Dimensional Shape Measurement for Specular Freeform Surfaces with the Quaternary Orthogonal Grid Fringes

Improved Dual-Frequency On-Line Phase Measuring Profilometry Based On Full-Cycle Equal Phase-Shift Algorithm

An Improved Phase Measuring Deflectometry Method for Defect Detection of Specular Reflection Surface

Specular Surface Shape Measurement with Orthogonal Dual-Frequency Fourier Transform Deflectometry

Integrated form-position measurement of large-aperture transparent elements based on stereoscopic phase measuring deflectometry