Abstract:Optical diffraction tomography (ODT) is an effective label-free technique for quantitatively refractive index imaging, which enables long-term monitoring of the internal three-dimensional (3D) structures and molecular composition of biological cells with minimal perturbation. However, existing optical tomographic methods generally rely on interferometric configuration for phase measurement and sophisticated mechanical systems for sample rotation or beam scanning. Thereby, the measurement is suspect to phase error coming from the coherent speckle, environmental vibrations, and mechanical error during data acquisition process. To overcome these limitations, we present a new ODT technique based on non-interferometric phase retrieval and programmable illumination emitting from a light-emitting diode (LED) array. The experimental system is built based on a traditional bright field microscope, with the light source replaced by a programmable LED array, which provides angle-variable quasi-monochromatic illumination with an angular coverage of ±37 degrees in both x and y directions (corresponding to an illumination numerical aperture of ∼0.6). Transport of intensity equation (TIE) is utilized to recover the phase at different illumination angles, and the refractive index distribution is reconstructed based on the ODT framework under first Rytov approximation. The missing-cone problem in ODT is addressed by using the iterative non-negative constraint algorithm, and the misalignment of the LED array is further numerically corrected to improve the accuracy of refractive index quantification. Experiments on polystyrene beads and thick biological specimens show that the proposed approach allows accurate refractive index reconstruction while greatly reduced the system complexity and environmental sensitivity compared to conventional interferometric ODT approaches.

Reflection-mode diffraction tomography of multiple-scattering samples on a reflective substrate from intensity images

Solving the Inverse Scattering Problem in Reflection-Mode Dynamic Speckle-Field Phase Microscopy (conference Presentation)

Reflective Coherent Diffraction Imaging with Binary Random Sampling and Updated Support Constraints

Scanning Interferometric Method for Measuring Group Delay of Dispersive Mirrors

High-throughput intensity diffraction tomography with a computational microscope

Differential internal multi-reflection method for nano-displacement measurement

Multi-wavelength Multi-Angle Reflection Tomography

Inverse scattering for reflection intensity phase microscopy

Optical diffraction tomography microscopy with transport of intensity equation using a light-emitting diode array

Stray light simulation and control in imaging systems including diffraction elements

High-Resolution Scanning X-ray Diffraction Microscopy

Non-interferometric Optical Diffraction Tomography Defying Matched Illumination Condition

Continuous-wave terahertz holographic diffraction tomography based on multiple scattering forward model

Elliptical mirror-based TIRF microscopy with shadowless illumination and adjustable penetration depth.

A New Reconstruction Approach for Reflection Mode Diffraction Tomography.

Diffraction Imaging Method Using the Pattern Operator in Migrated Dip-angle Gathers

Decoupling of Complex Refractive Index in Transport of Intensity Diffraction Tomography Microscopy

A new reconstruction approach in diffraction ultrasound tomography: Combine transmission mode with reflection mode tomography

Diffraction Tomography for a Generalized Incident Field

Analysis of diffraction imaging in non-conjugate configurations.