Multi-wavelength Multi-Angle Reflection Tomography

Ting Zhang,Kevin Unger,Guillaume Maire,Patrick C. Chaumet,Anne Talneau,Charan Godhavarti,Hugues Giovannini,Kamal Belkebir,Anne Sentenac
DOI: https://doi.org/10.1364/oe.26.026093
IF: 3.8
2018-01-01
Optics Express
Abstract:We have developed a reflection tomographic microscope in which the sample is reconstructed from different holograms recorded under various angles and wavelengths of incidence. We present an iterative inversion algorithm based on a rigorous modeling of the wave-sample interaction that processes all the data simultaneously to estimate the sample permittivity distribution. We show that using several wavelengths permits a significant improvement of the reconstruction, especially along the optical axis.
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