Abstract:High spatial resolution is the goal of many imaging systems. While designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task, creating a complex speckle pattern with wavelength-limited spatial features is easily accomplished with a simple random diffuser. With this observation and the concept of near-field ptychography, we report a new imaging modality, termed near-field Fourier ptychography, to address high-resolution imaging challenges in both microscopic and macroscopic imaging settings. 'Near-field' refers to placing the object at a short defocus distance with a large Fresnel number. We project a speckle pattern with fine spatial features on the object instead of directly resolving the spatial features via a high-resolution lens. We then translate the object (or speckle) to different positions and acquire the corresponding images by using a low-resolution lens. A ptychographic phase retrieval process is used to recover the complex object, the unknown speckle pattern, and the coherent transfer function at the same time. In a microscopic imaging setup, we use a 0.12 numerical aperture (NA) lens to achieve an NA of 0.85 in the reconstruction process. In a macroscale photographic imaging setup, we achieve ~7-fold resolution gain by using a photographic lens. The collection optics do not determine the final achievable resolution; rather, the speckle pattern's feature size does. This is similar to our recent demonstration in fluorescence imaging settings (Guo et al., Biomed. Opt. Express, 9(1), 2018). The reported imaging modality can be employed in light, coherent X-ray, and transmission electron imaging systems to increase resolution and provide quantitative absorption and object phase contrast.

Solving the Inverse Scattering Problem in Reflection-Mode Dynamic Speckle-Field Phase Microscopy (conference Presentation)

Modeling the Depth-Sectioning Effect in Reflection-Mode Dynamic Speckle-Field Interferometric Microscopy.

High-sensitivity Quantitative Phase Microcopy (conference Presentation)

Multi-slice Ptychographic Imaging with Multistage Coarse-to-fine Reconstruction

Phase-coded Speckle Illumination for Laser Fourier Ptychographic Microscopy

Extended Depth of Field Reconstruction with Complex Field Estimation

Diffraction Tomography Based on Fourier Ptychographic Microscopy with the Multiple Scattering Model

Extended Depth-Resolved Imaging Through a Thin Scattering Medium with PSF Manipulation

Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone

Speckle-structured illumination for 3D phase and fluorescence computational microscopy

Non-Confocal 3D Reconstruction in Volumetric Scattering Scenario.

High-throughput intensity diffraction tomography with a computational microscope

Reflection-mode diffraction tomography of multiple-scattering samples on a reflective substrate from intensity images

Improved Multi-Slice Fourier Ptychographic Diffraction Tomography Based on High-Numerical-aperture Illuminations

Inverse scattering for reflection intensity phase microscopy

3D Object Imaging through Scattering Media

Non-Invasive Imaging Based On Speckle Pattern Estimation And Deconvolution

Deep imaging inside scattering media through virtual spatiotemporal wavefront shaping

Near-field Fourier Ptychography: Super-Resolution Phase Retrieval Via Speckle Illumination.

3d Fourier Ptychographic Microscopy Based On The Beam Propagation Method And Time-Reversal Scheme

Improved multi-slice Fourier ptychographic microscopy technique for high-accuracy three-dimensional tomography under oblique illuminations