Diffraction Tomography for a Generalized Incident Field

Clemens Kirisits,Noemi Naujoks,Otmar Scherzer
2024-03-25
Abstract:Diffraction tomography is an inverse scattering technique used to reconstruct the spatial distribution of the material properties of a weakly scattering object. The object is exposed to radiation, typically light or ultrasound, and the scattered waves induced from different incident field angles are recorded. In conventional diffraction tomography, the incident wave is assumed to be a monochromatic plane wave, an unrealistic simplification in practical imaging scenarios. In this article, we extend conventional diffraction tomography by introducing the concept of customized illumination scenarios, with a pronounced emphasis on imaging with focused beams. We present a new forward model that incorporates a generalized incident field and extends the classical Fourier diffraction theorem to the use of this incident field. This yields a new two-step reconstruction process which we comprehensively evaluate through numerical experiments.
Numerical Analysis
What problem does this paper attempt to address?
This paper primarily investigates the extension of diffraction tomography in the case of non-planar wave incidence, particularly focusing on the application of focused wave beams. Traditional diffraction tomography assumes the incident wave to be a monochromatic plane wave, but this approach is not realistic in practical applications. The paper proposes a new forward model that describes the incident wave as a superposition of plane waves with different directions and amplitudes, to accommodate a wider range of illumination scenarios, especially focused wave beams. The paper first introduces the mathematical model, including the wave propagation model, Born approximation, and generation of scattered waves. Then, by extending the Fourier diffraction theorem, a new theoretical foundation is established, where the relationship between the measured data and the scattering potential is not direct but indirectly linked through an integral operator. This leads to a reconstruction process that consists of two steps: first, extracting Fourier data from the measured data through truncated singular value decomposition; and second, recovering the scattering potential through Fourier inverse transform. The paper also discusses numerical experiments to evaluate the effectiveness of the proposed method, with a specific focus on applications in ultrasound imaging, where focused wave beams can improve far-field resolution. By comparing different experimental settings, such as the scattering effects of plane waves and focused wave beams, the importance of properly considering the illumination scenario in the reconstruction of tomographic imaging is emphasized. In conclusion, this paper aims to address the handling of complex incident waveforms in diffraction tomography, in order to improve imaging quality and applicability, particularly in practical applications such as medical ultrasound imaging.