Abstract:In situ temperature ellipsometry is used to probe the expansion of a collection of conjugated polymers and small molecules. Correlation of the melt expansion with the literature derived g‐parameters, in other words the disorder, in the polymer systems is observed contrary to prior understanding. Low temperature relaxations are observed that suggest reorientation of the polymer systems and reduction of as‐cast anisotropy. The molecular self‐organization and reorganization and thus volumetric and density changes during structural relaxation and melting of modern organic semi‐conducting materials remains largely unknown, particularly in the device relevant thin film geometry where the initial state may be structurally quenched away from equilibrium. Here, the apparent mass‐thickness of a range of semi‐conducting polymeric or molecular model materials systems is measured through in situ ellipsometry. Surprisingly, the volume changes upon melting correlate inversely, with a few exceptions, to the quality of crystallinity found via x‐ray methods (i.e., directly correlate with the paracrystalline g‐parameter) rather than the melting enthalpy that is possibly a proxy for the degree of crystallinity. This study also observes changes in orientation and/or density due to segmental relaxation during the first heat, thus complementing other characterization methods that measure relaxation or reorganization transitions. Semiconducting materials exhibit very large melt expansion and a richer phase‐behavior compared to commodity polymers, presumably due to their complex chemical structure. The results delineate an important and novel structure‐function relation that, together with simulations constrained by these results, will lead to better rational design of semi‐conducting materials.

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Grazing-incidence Small Angle X-Ray Scattering Studies of Nanoscale Polymer Gratings

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X-Ray Fluorescence Correlation Spectroscopy: A Method for Studying Particle Dynamics in Condensed Matter

Simultaneous X-Ray-Diffraction and Differential Scanning Calorimetry (xddsc) in Studies of Molecular and Liquid-Crystals

Small Angle X-ray and Neutron Scattering in the Study of Polymers and Supramolecular Systems

GISAXS in the Study of Supramolecular and Hybrid Liquid Crystals

Extensional Rheometer for in Situ X-Ray Scattering Study on Flow-Induced Crystallization of Polymer

Nanostructure of Unconventional Liquid Crystals Investigated by Synchrotron Radiation

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X-Ray Scattering Technologies of Microstructure Analysis of Thin Films

Low Voltage Scanning Electron Microscopy and Atomic Force Microscopy: State-of-the-art Microscopy Techniques for Investigations of Polymer Single Crystals

Ultrafast Time Resolved X-Ray Diffraction, Extended X-Ray Absorption Fine Structure And X-Ray Absorption Near Edge Structure

Melt Expansion and Thermal Transitions of Semiconducting Polymers in Thin Films

Dynamics and rheology under continuous shear flow studied by x-ray photon correlation spectroscopy

Dynamic X-ray Coherent Diffraction Analysis: Bridging the Time Scales between Imaging and Photon Correlation Spectroscopy

In Situ Synchrotron Radiation Techniques: Watching Deformation-induced Structural Evolutions of Polymers

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Theory of X-ray Reflection Broadening for Textures with Double-Axis Averaging: from Semicrystalline Polymers Exhibiting Twisted Lamellar Growth to Discotic Liquid Crystals

Observation of molecular motions in polymer thin films by laboratory grazing incidence diffracted X-ray blinking

Phase Segregation in Polymer Thin Films: Elucidations by X-ray and Scanning Force Microscopy