Atomically sharp interface enabled ultrahigh-speed non-volatile memory devices

Liangmei Wu,Aiwei Wang,Jinan Shi,Jiahao Yan,Zhang Zhou,Ce Bian,Jiajun Ma,Ruisong Ma,Hongtao Liu,Jiancui Chen,Yuan Huang,Wu Zhou,Lihong Bao,Min Ouyang,Stephen J. Pennycook,Sokrates T. Pantelides,Hong-Jun Gao
DOI: https://doi.org/10.1038/s41565-021-00904-5
IF: 38.3
2021-05-03
Nature Nanotechnology
Abstract:The development of high-performance memory devices has played a key role in the innovation of modern electronics. Non-volatile memory devices have manifested high capacity and mechanical reliability as a mainstream technology; however, their performance has been hampered by low extinction ratio and slow operational speed. Despite substantial efforts to improve these characteristics, typical write times of hundreds of micro- or milliseconds remain a few orders of magnitude longer than that of their volatile counterparts. Here we demonstrate non-volatile, floating-gate memory devices based on van der Waals heterostructures with atomically sharp interfaces between different functional elements, achieving ultrahigh-speed programming/erasing operations in the range of nanoseconds with extinction ratio up to 10<sup>10</sup>. This enhanced performance enables new device capabilities such as multi-bit storage, thus opening up applications in the realm of modern nanoelectronics and offering future fabrication guidelines for device scale up.
materials science, multidisciplinary,nanoscience & nanotechnology
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