Toward Preeminent Throwing Power from a Novel Alkaline Copper Electronic Electroplating Bath with Composite Coordination agents

Wei‐Qing Li,Lei Jin,Jia‐Qiang Yang,Zhao‐Yun Wang,Dongping Zhan,Fang‐Zu Yang,Zhong‐Qun Tian,Wei-Qing Li,Jia-Qiang Yang,Zhao-Yun Wang,Fang-Zu Yang,Zhong-Qun Tian
DOI: https://doi.org/10.1002/celc.202200423
IF: 4
2022-05-12
ChemElectroChem
Abstract:In this work, we successfully developed an electronic copper electroplating bath with low copper ion concentration and preeminent throwing power in through hole (TH) thickening of the printed circuit board (PCB). Based on the weak alkaline bath containing the composite complexants of citrate (Cit) and ethylenediamine (En), their synergistic effects on the preeminent throwing power are carefully investigated. The UV‐vis spectroscopy results illustrate that En exhibits a stronger coordination ability with Cu (II) ion than citrate, and the stoichiometric coordination ratio between En and Cu (II) ion is 2:1. The linear sweep voltammetry (LSV) results show that the electro‐reduction peak potential of Cit‐Cu coordination ion is ‐0.55 V (vs. Hg/HgO), while the En‐Cu ion is at a more negative potential of ‐0.82 V. The in situ Fourier transform infrared (FTIR) spectroscopy reveals that the adsorptions of the Cit‐Cu and En‐Cu coordination ions are of potential dependence on the copper electrode. The Cit‐Cu coordination ion is easily adsorbed at the interior sites of through holes with lower over‐potential to promote the growth of copper coating. Moreover, the En‐Cu coordination ion adsorbs preferably on the surface and the edge of through hole for its higher electro‐reduction overpotential, to hinder the germinating of copper nuclear. The cross‐section observation of optical microscope proves that the throwing power of novel copperelectroplating bath behaves surpassingly, up to 105.8%.
electrochemistry
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