Three-dimensional near-field analysis through peak force scattering-type near-field optical microscopy

Haomin Wang,Jiahan Li,James H. Edgar,Xiaoji G. Xu
DOI: https://doi.org/10.1039/c9nr08417g
IF: 6.7
2020-01-01
Nanoscale
Abstract:Peak force scanning near-field optical microscopy (PF-SNOM) is instrumental in exploring tomographic polaritonic behaviors of two-dimensional (2D) materials at the nanoscale.
materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology,chemistry
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