Abstract:Electric field enhancement mediated through sharp tips in scattering-type scanning near-field optical microscopy (s-SNOM) enables optical material analysis down to the 10-nm length scale, and even below. Nevertheless, mostly the out-of-plane electric field component is considered here due to the lightning rod effect of the elongated s-SNOM tip being orders of magnitude stronger as compared to any in-plane field component. Nonetheless, the fundamental understanding of resonantly excited near-field coupled systems clearly allows us to take profit from all vectorial components, especially also from the in-plane ones. In this paper, we theoretically and experimentally explore how linear polarization control of both near-field illumination and detection, can constructively be implemented to (non-)resonantly couple to selected sample permittivity tensor components, e.g. explicitly also to the in-plane directions. When applying the point-dipole model, we show that resonantly excited samples respond with a strong near-field signal, to all linear polarization angles. We then experimentally investigate the polarization-dependent responses for both non-resonant (Au) and phonon-resonant (3C-SiC) sample excitations at a 10.6~$\mu$m and 10.7~$\mu$m incident wavelength using a tabletop CO$_2$ laser. Varying the illumination polarization angle thus allows for quantitatively comparing the scattered near-field signatures for the two wavelengths. Finally, we compare our experimental data to simulation results, and thus gain the fundamental understanding of the polarization's influence on the near-field interaction. As a result, the near-field components parallel and perpendicular to the sample surface can be easily disentangled and quantified through their polarization signatures, connecting them directly to the sample's local permittivity.

Analysis of Scattering-type Scanning Near-field Optical Microscopy for Residual-strain Measurements

Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM)

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy.

Reconstruction of the Near-Field Electric Field by SNOM Measurement.

Quantum Modeling of Scanning Near-Field Optical photons Scattered by an Atomic-Force Microscope Tip for Quantum Metrology

Surface and edge resonances of phonon-polaritons in scattering-type near-field optical microscopy

Surface Patterning for Multi-Scale Strain Analysis of In-Situ Sem Mechanical Experiments

Polarization sensitivity in scattering-type scanning near-field optical microscopy -- towards nanoellipsometry

Analysis of visible and infrared spectroscopic detection in scattering scanning near-field optical microscopy

Recent Efforts in Modelling Combined Rate, Size and Thermal Effects on Single Crystal Strength

Scanning Near-field Optical Microscope and Application

Identification of weak molecular absorption in single-wavelength s-SNOM images

Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices

Nanotips for 0.5THz scattering scanning near field microscopy

Calibration method for complex permittivity measurements using s-SNOM combining multiple tapping harmonics

Near-field infrared nanoscopic study of EUV- and e-beam-exposed hydrogen silsesquioxane photoresist

Performance of visible and mid-infrared scattering-type near-field optical microscopes

STUDY ON LIGHT INTENSITY DISTRIBUTION OF TAPERED-FIBER IN NEAR-FIELD SCANNING MICROSCOPY

Scattering of Electromagnetic Waves from a Cone with Conformal Mapping: Application to Scanning Near-Field Optical Microscope

Three-dimensional near-field analysis through peak force scattering-type near-field optical microscopy