Abstract:Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or phase transitions in 2D materials or exotic conductors. Applications, however, are strongly challenged by the limited signal to noise ratio. One major reason is that standard atomic force microscope (AFM) tips, which have made s-SNOM a highly practical and rapidly emerging tool, provide weak scattering efficiencies at THz frequencies. Here we report a combined experimental and theoretical study of commercial and custom-made AFM tips of different apex diameter and length, in order to understand signal formation in THz s-SNOM and to provide insights for tip optimization. Contrary to common beliefs, we find that AFM tips with large (micrometer-scale) apex diameter can enhance s-SNOM signals by more than one order of magnitude, while still offering a spatial resolution of about 100 nm at a wavelength of 119 micron. On the other hand, exploiting the increase of s-SNOM signals with tip length, we succeeded in sub-15 nm resolved THz imaging employing a tungsten tip with 6 nm apex radius. We explain our findings and provide novel insights into s-SNOM via rigorous numerical modeling of the near-field scattering process. Our findings will be of critical importance for pushing THz nanoscopy to its ultimate limits regarding sensitivity and spatial resolution.

Performance of visible and mid-infrared scattering-type near-field optical microscopes

Analysis of visible and infrared spectroscopic detection in scattering scanning near-field optical microscopy

A fully automated dual-tip scanning near-field optical microscope for localized optical excitation and detection in the visible and near-infrared

Setup and Application of Scanning Near-Field Optical Microscopy

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Scanning Near-field Optical Microscope and Application

Identification of weak molecular absorption in single-wavelength s-SNOM images

Instrumentation for dual-probe scanning near-field optical microscopy

Probes for Ultrasensitive THz Nanoscopy

A Novel Phase-Sensitive Scanning Near-Field Optical Microscope

Design and construction of a versatile scanning near‐field optical microscope for fluorescence imaging of single molecules

Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy

Design and Applications of a Multi-Mode Scanning Near-Field Optical Microscope

Near-field optical microscopy with uncoated tips: Calibration, chemical contrast on organic crystals, and photolithography

Terahertz Nano-Imaging with s-SNOM

Picocavity-enhanced near-field optical microscopy with 1 nm resolution

Quantum Modeling of Scanning Near-Field Optical photons Scattered by an Atomic-Force Microscope Tip for Quantum Metrology

Experimental Study of the Optical Waveguides by Scanning Near-Field Optical Microscopy (Nsom)

Surface and edge resonances of phonon-polaritons in scattering-type near-field optical microscopy

Near-field infrared nanoscopic study of EUV- and e-beam-exposed hydrogen silsesquioxane photoresist

A Terahertz Confocal Microscope for Far-Field Thermal Radiation Detection and Near-Field Sub-Wavelength Imaging