Probes for Ultrasensitive THz Nanoscopy

Curdin Maissen,Shu Chen,Elizaveta Nikulina,Alexander Govyadinov,Rainer Hillenbrand

DOI: https://doi.org/10.1021/acsphotonics.9b00324

2021-05-25

Abstract:Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or phase transitions in 2D materials or exotic conductors. Applications, however, are strongly challenged by the limited signal to noise ratio. One major reason is that standard atomic force microscope (AFM) tips, which have made s-SNOM a highly practical and rapidly emerging tool, provide weak scattering efficiencies at THz frequencies. Here we report a combined experimental and theoretical study of commercial and custom-made AFM tips of different apex diameter and length, in order to understand signal formation in THz s-SNOM and to provide insights for tip optimization. Contrary to common beliefs, we find that AFM tips with large (micrometer-scale) apex diameter can enhance s-SNOM signals by more than one order of magnitude, while still offering a spatial resolution of about 100 nm at a wavelength of 119 micron. On the other hand, exploiting the increase of s-SNOM signals with tip length, we succeeded in sub-15 nm resolved THz imaging employing a tungsten tip with 6 nm apex radius. We explain our findings and provide novel insights into s-SNOM via rigorous numerical modeling of the near-field scattering process. Our findings will be of critical importance for pushing THz nanoscopy to its ultimate limits regarding sensitivity and spatial resolution.

Optics,Applied Physics

What problem does this paper attempt to address?

The main problem that this paper attempts to solve is to improve the signal strength and spatial resolution of scattering - type scanning near - field optical microscopes (s - SNOM) in the terahertz (THz) frequency band. Specifically, researchers studied the performance of atomic force microscope (AFM) probes with different apex diameters and lengths in THz s - SNOM through experiments and theoretical research to understand the signal formation mechanism and provide guidance for probe optimization.

### Main problems
1. **Signal strength enhancement**:
- The scattering efficiency of standard AFM probes at THz frequencies is low, resulting in insufficient signal strength. By studying probes with different apex diameters, the paper found that probes with larger apex diameters (on the micrometer scale) can significantly enhance the s - SNOM signal, with an increase of more than one order of magnitude.
- By increasing the probe length, the signal strength was further improved. Using a custom - made tungsten probe with a 6 - nanometer apex radius, sub - 15 - nanometer (<λ/8000) spatial resolution imaging was achieved.

2. **Spatial resolution optimization**:
- Although using probes with larger apex diameters can significantly enhance the signal, their impact on spatial resolution is relatively small and can still maintain a resolution of about 100 nanometers.
- Through numerical simulation and experimental verification, researchers found that an increase in probe length has a significant impact on signal strength, and although an increase in apex diameter will reduce spatial resolution, this reduction is moderate.

### Key findings
- **Signal enhancement mechanism**:
- When the apex diameter of the probe increases, although the near - field enhancement effect weakens, the larger near - field interaction area leads to enhanced capacitive coupling, thereby increasing the near - field scattering signal.
- An increase in probe length can match the geometric antenna resonance, further enhancing the near - field signal.

- **Trade - off between spatial resolution and signal strength**:
- Probes with larger apex diameters increase signal strength while only moderately reducing spatial resolution.
- By optimizing probe design, signal strength can be greatly increased while maintaining high spatial resolution, thus promoting the development of THz nano - imaging technology.

### Experimental methods
- **Experimental setup**:
- A commercial AFM - s - SNOM system was used, combined with a tuned THz gas laser and a GaAs - based Schottky diode detector.
- Amplitude - and phase - resolved near - field imaging was carried out by interferometry.

- **Sample selection**:
- The metal/dielectric interface of a commercial hard disk read - write head was used as a test sample, and the absolute signal amplitude, material contrast, and lateral resolution were determined by recording line scans.

- **Numerical simulation**:
- Full - wave numerical simulation (COMSOL) was used to study the near - field scattering process of the probe - sample system and explain the experimentally observed phenomena.

### Conclusion
This study systematically investigated the performance of AFM probes with different apex diameters and lengths in THz s - SNOM, revealing the mechanisms of signal enhancement and spatial resolution optimization. These findings are of great significance for promoting the development of THz nano - imaging technology, especially in terms of improving sensitivity and spatial resolution.