A Terahertz Confocal Microscope for Far-Field Thermal Radiation Detection and Near-Field Sub-Wavelength Imaging

Qianchun Weng,Le Yang,Jie Xu,Qingbai Qian,Haochi Yu,Bo Zhang,Zhenghua An,Ziqiang Zhu,Wei Lu

DOI: https://doi.org/10.1117/12.2212029

2015-01-01

Abstract:We present a novel scattering-type scanning near-field optical microscope (s-SNOM) operating in the terahertz (THz) wavelength. A home-made ultra-high sensitive detector named charge sensitive infrared phototransistor (CSIP, detection wavelength similar to 15 mu m) is equipped for spontaneous thermal radiation detection (external illumination should be avoided). Thermal emission from room-temperature objects is collected by a cassegrain objective lens placed above the sample, and focused to a pinhole (d= 250 mu m) which is kept in liquid-helium (LHe) temperature(4.2 K). With the background radiation from environment efficiently blocked by the low-temperature pinhole, the detector is only sensitive to the THz radiation from a small spot (similar to lambda) on sample surface (the confocal point). As a result, thermal radiation spontaneously emitted by object itself is measured with an excellent spatial resolution of similar to 14 mu m (diffraction-limit). For overcoming the diffraction limit by detecting the near-field evanescent waves, this THz microscope is combined with a home-built atomic-force microscope (AFM). With sharp AFM tip (< 100 nm) scattering the evanescent waves with an improved tip-modulation method, we successfully obtained thermal near-field images with a spatial resolution of similar to 100 nm, which is already less than 1% of the detection wavelength (15 mu m). This THz s-SNOM should be a powerful tool for various material research down to the nanometer scale.