Development of optical fiber probe for the scanning near-field optical microscope

Xiumei Liu,Jia Wang
1999-01-01
Abstract:The scanning near-field optical microscope (SNOM) breaks the resolution limit set up by the diffraction of conventional optical microscope, hence it has wide application prospect in many fields. The shape and size of the scanning probe tip are two of the key factors affecting the resolution of SNOM. A novel hot drawing method for making probe was put forward which combined the hot drawing method with the chemical etching method in an experimental setup to improve the successful rate of probe fabrication. The results show that the optimal size of the probe tips obtained with the two methods can achieve 96 nm and 76 nm respectively.
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