Abstract:Electric field enhancement mediated through sharp tips in scattering-type scanning near-field optical microscopy (s-SNOM) enables optical material analysis down to the 10-nm length scale, and even below. Nevertheless, mostly the out-of-plane electric field component is considered here due to the lightning rod effect of the elongated s-SNOM tip being orders of magnitude stronger as compared to any in-plane field component. Nonetheless, the fundamental understanding of resonantly excited near-field coupled systems clearly allows us to take profit from all vectorial components, especially also from the in-plane ones. In this paper, we theoretically and experimentally explore how linear polarization control of both near-field illumination and detection, can constructively be implemented to (non-)resonantly couple to selected sample permittivity tensor components, e.g. explicitly also to the in-plane directions. When applying the point-dipole model, we show that resonantly excited samples respond with a strong near-field signal, to all linear polarization angles. We then experimentally investigate the polarization-dependent responses for both non-resonant (Au) and phonon-resonant (3C-SiC) sample excitations at a 10.6~$\mu$m and 10.7~$\mu$m incident wavelength using a tabletop CO$_2$ laser. Varying the illumination polarization angle thus allows for quantitatively comparing the scattered near-field signatures for the two wavelengths. Finally, we compare our experimental data to simulation results, and thus gain the fundamental understanding of the polarization's influence on the near-field interaction. As a result, the near-field components parallel and perpendicular to the sample surface can be easily disentangled and quantified through their polarization signatures, connecting them directly to the sample's local permittivity.

Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy.

Model for quantitative tip-enhanced spectroscopy and the extraction of nanoscale-resolved optical constants

Rigorous Numerical Modeling of Scattering-Type Scanning Near-Field Optical Microscopy and Spectroscopy

Analysis of Scattering-type Scanning Near-field Optical Microscopy for Residual-strain Measurements

Quantitative Microwave Near-Field Microscopy of Dielectric Properties

A comprehensive optical analysis of nanoscale structures: from thin films to asymmetric nanocavities

Surface and edge resonances of phonon-polaritons in scattering-type near-field optical microscopy

Generalized Mie theory for full-wave numerical calculations of scattering near-field optical microscopy with arbitrary geometries

Analytical Model for Phonon Transport Analysis of Periodic Bulk Nanoporous Structures

Generalized spectral method for near-field optical microscopy

A Systematic Material Characterization Method via Near-Field Scanning Microwave Microscopy

An Ab Initio, Fully Coherent, Semi-Analytical Model of Surface-Roughness-Induced Scattering

Comparative analysis of two models for the optical response of a thin slab: a film of finite thickness versus a surface current sheet

Quantitative scattering theory of near-field response for 1D polaritonic structures

Modeling nonlinear optical interactions of focused beams in bulk crystals and thin films: A phenomenological approach

Polarization sensitivity in scattering-type scanning near-field optical microscopy -- towards nanoellipsometry

Analytic Model Reveals Local Molecular Polarizability Changes Induced by Collective Strong Coupling in Optical Cavities

Insights into the need for ab-initio calculations to accurately predict the optical properties of metallic carbon nanotubes based on experimental confrontation

Quantum Modeling of Scanning Near-Field Optical photons Scattered by an Atomic-Force Microscope Tip for Quantum Metrology

Visualization of atomistic optical waves in crystals

Scattering of Electromagnetic Waves from a Cone with Conformal Mapping: Application to Scanning Near-Field Optical Microscope