snompy: a package for modelling scattering-type scanning near-field optical microscopy

Tom Vincent,Xinyun Liu,Daniel Johnson,Lars Mester,Nathaniel Huang,Olga Kazakova,Rainer Hillenbrand,Jessica Louise Boland
2024-05-31
Abstract:Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful technique for extreme subwavelength imaging and spectroscopy, with around 20 nm spatial resolution. But quantitative relationships between experiment and material properties requires modelling, which can be computationally and conceptually challenging. In this work, we present snompy an open-source Python library which contains implementations of two of the most common s-SNOM models, the finite dipole model (FDM) and the point dipole model (PDM). We show a series of typical uses for this package with demonstrations including simulating nano-Fourier transform infrared (FTIR) spectra and recovering permittivity from experimental s-SNOM data. We also discuss the challenges faced with this sort of modelling, such as competing descriptions of the models in literature, and finite size effects. We hope that snompy will make quantitative s-SNOM modelling more accessible to the wider research community, which will further empower the use of s-SNOM for investigating nanoscale material properties.
Materials Science,Optics
What problem does this paper attempt to address?
The main objective of this paper is to address the challenges in modeling scattering-type scanning near-field optical microscopy (s-SNOM) to enhance its quantitative analysis capabilities when studying nanoscale material properties. Specifically: 1. **Development of Toolkit**: The paper introduces `snompy`, an open-source Python library that implements two common s-SNOM models—the Finite Dipole Model (FDM) and the Point Dipole Model (PDM). This allows users to conveniently simulate and analyze s-SNOM signals. 2. **Simulation and Experimental Data Processing**: Through `snompy`, researchers can simulate lock-in amplifier measurements, nano-Fourier transform infrared (nano-FTIR) spectroscopy, and recover dielectric constants from experimental data. These functionalities are crucial for understanding and interpreting s-SNOM experimental results. 3. **Improving Computational Efficiency**: The paper discusses how to use the Gauss-Laguerre quadrature method to convert semi-infinite integrals into finite sums, thereby improving computational efficiency. Additionally, an improved Transfer Matrix Method (TMM) is introduced for simulating the far-field reflection coefficients of multilayer structures. 4. **Model Comparison and Parameter Calibration**: The paper demonstrates the impact of different models (such as PDM and FDM) and various parameters on simulation results, emphasizing the importance of selecting appropriate model parameters. For example, the geometry and amplitude of the AFM probe can significantly affect s-SNOM signals. In summary, this paper aims to simplify the s-SNOM modeling process by providing a powerful toolkit, enabling more researchers to utilize s-SNOM technology to deeply investigate the optical properties of nanoscale materials.