Quantitative imaging of advanced nanostructured materials with scattering-type scanning near-field optical microscopy

Stefan G. Stanciu,Denis E. Tranca,Laura Pastorino,Stefania Boi,Young Min Song,Young Jin Yoo,Satoshi Ishii,Fang Yang,Aiguo Wu,Radu Hristu,George A. Stanciu
DOI: https://doi.org/10.1117/12.2527401
2019-01-01
Abstract:Scattering-type Scanning Near Field Optical Microscopy (s-SNOM) has been demonstrated as a valuable tool for revealing important properties of materials at nanoscale. Recent proof-of-concept experiments have shown that, among others, s-SNOM can provide quantitative information on the real and imaginary parts of the dielectric function, and hence of intrinsic optical properties of materials and biological samples. In this work we further explored these capabilities in several experiments dealing with microcapsules for drug delivery, ultra-thin optical coatings with tunable color properties, and two types of nanoparticles with important applications in energy storage and conversion, or biosensing and theranostics.
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