Phase-pure wafer-scale InSe for future transistors

Wenjing Zhao,Yang Wu
DOI: https://doi.org/10.1016/j.matt.2023.09.001
IF: 18.9
2023-10-01
Matter
Abstract:A thickness-controlled, phase-pure 2D InSe wafer of over 2 inches is successfully produced through vertical cold-walled MOCVD. The field-effect electrical properties of such InSe wafers are superior to those of mechanically exfoliated bulk crystals or PLD-grown films.
materials science, multidisciplinary
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