Characterizing the chemical potential disorder in the topological insulator thin films

Jens Brede,Mahasweta Bagchi,Adrian Greichgauer,Anjana Uday,Andrea Bliesener,Gertjan Lippertz,Roozbeh Yazdanpanah,Alexey Taskin,Yoichi Ando
DOI: https://doi.org/10.1103/physrevmaterials.8.104202
IF: 3.98
2024-10-31
Physical Review Materials
Abstract:Compensation doping is a successful strategy to realize bulk-insulating topological insulators, but it comes at the cost of large chemical-potential fluctuations. Here, STM is used to map these fluctuations in (Bi 1−x Sb x ) 2 Te 3 thin films with varying Sb-concentration x. The fluctuation amplitude is found to be 5 – 14 meV in quasi-bulk-insulating films, but it increases to 30 – 40 meV in highly bulk-insulating films. Landau-level spectroscopy under perpendicular magnetic fields allows for identifying the Dirac point. At x ≈ 0.65, the Fermi level is found to lie within 10 meV from the Dirac point and yet the potential fluctuations are relatively modest at 14 meV. [Phys. Rev. Materials 8, 104202] Published Tue Oct 29, 2024
materials science, multidisciplinary
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