Diffusion of hydrogen in crystalline silicon

Sabrina Bedard,Laurent J. Lewis
DOI: https://doi.org/10.1103/PhysRevB.61.9895
1999-08-10
Abstract:The coefficient of diffusion of hydrogen in crystalline silicon is calculated using tight-binding molecular dynamics. Our results are in good quantitative agreement with an earlier study by Panzarini and Colombo [Phys. Rev. Lett. 73, 1636 (1994)]. However, while our calculations indicate that long jumps dominate over single hops at high temperatures, no abrupt change in the diffusion coefficient can be observed with decreasing temperature. The (classical) Arrhenius diffusion parameters, as a consequence, should extrapolate to low temperatures.
Materials Science
What problem does this paper attempt to address?
The problem that this paper attempts to solve is the **accurate determination of the diffusion coefficient of hydrogen in crystalline silicon**. Specifically, the authors hope to calculate the diffusion coefficient of hydrogen in crystalline silicon by using the tight - binding molecular dynamics (TBMD) method and explore its behavior with temperature variation. ### Problem Background The diffusion of hydrogen in crystalline silicon is an important physical phenomenon because it has a profound impact on the optical and electronic properties of semiconductor materials. Hydrogen usually exists in silicon as an impurity or defect passivator, and its diffusion behavior will affect the transport characteristics of the material. Therefore, understanding the diffusion mechanism of hydrogen is crucial for controlling the performance of semiconductor materials. Although many experimental and theoretical studies have attempted to determine the diffusion coefficient of hydrogen in crystalline silicon, no consensus has been reached so far. The results between different studies vary greatly, especially at low temperatures, where the experimental data are more dispersed. In addition, the change of the diffusion coefficient with temperature does not always follow the ideal Arrhenius relationship, which makes it difficult to accurately determine the diffusion parameters. ### Main Contributions of the Paper 1. **Long - time simulation using the TBMD method**: The authors used the TBMD method to conduct a simulation for as long as 7 nanoseconds, a time scale that has not been reached in previous studies. This helps to improve the statistical quality and reduce errors. 2. **Verify and extend previous research results**: The authors' work confirmed the previous findings of Panzarini and Colombo et al., that long - jumps are dominant at high temperatures, but no sudden change in the diffusion coefficient was observed during the cooling process. This indicates that the Arrhenius diffusion parameters can be extrapolated to the low - temperature range. 3. **Analyze the diffusion mechanism**: Through the van Hove autocorrelation function, the authors analyzed in detail the motion patterns of hydrogen atoms at different temperatures. The results show that at low temperatures, diffusion is mainly completed through single - jumps; while at high temperatures, more long - jumps occur. ### Conclusion The main conclusion of the paper is that the diffusion coefficient of hydrogen in crystalline silicon exhibits a complex jumping mechanism at high temperatures, but in the classical range, the Arrhenius diffusion parameters can be reasonably extrapolated to low temperatures. However, considering the possible influence of quantum effects at low temperatures, future research needs to further explore the influence of these effects. ### Formula Representation The Arrhenius formula involved in the paper is: \[ D(T) = D_0 \exp\left(-\frac{E_A}{k_B T}\right) \] where: - \( D(T) \) is the diffusion coefficient - \( D_0 \) is the frequency factor - \( E_A \) is the activation energy - \( k_B \) is the Boltzmann constant - \( T \) is the absolute temperature Through these studies, the authors provide a more in - depth understanding of the diffusion behavior of hydrogen in crystalline silicon and lay the foundation for further research.