Controlled Deposition of Silver Indium Sulfide Ternary Semiconductor Thin Films by Chemical Bath Deposition

Tai-Chou Lee,Chia-Hung Lai,Lihua Lin,Ching-Chen Wu
DOI: https://doi.org/10.1021/CM702081H
2008-06-17
Abstract:An aqueous method for the deposition of silver indium sulfide ternary semiconductor thin films is presented. According to grazing-incidence X-ray diffraction studies, a single phase of AgInS2 with orthorhombic structure or a single phase of AgIn5S8 with cubic spinel structure can be selectively grown on 3-mercaptopropyl-trimethoxysilane-modified glass substrates. As-deposited thin films were annealed for 1 h in an argon environment at 400  °C in a tube furnace. It was found that when [Ag]/[In] = 1 in the precursor solution, AgInS2 was obtained. On the other hand, AgIn5S8 resulted from [Ag]/[In] ≤ 0.33 in the precursor solution. The energy gap, determined from transmission and reflection spectra, is located between 1.8 and 2.0 eV. The thickness of the thin films was in the range of 500−700 nm. Electrical resistivity was on the order of 104 Ω-cm. In addition, silver indium sulfide crystals were grown on octadecyltrichlorosilane-modified glass substrates without any post-thermal treatment. Powder X-ray diffr...
Engineering,Materials Science
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