Abstract:This paper proposes a new method for measurements of dielectric properties at microwave frequency. The measuring structure is a nonradiative dielectric resonator which is made up of a circular-symmetry cross shaped dielectric and two conducting plates each having a center hole. The dielectric is sandwiched between the two metal plates. Both the resonant TM011 and TE011 modes can be applied in this resonator. The radial mode matching method is employed for analyzing the field distributions, while the transmission-mode Q-factor measurement technique is used for precise determination of unloaded Q(0)-factor. Complex permittivities of several plastics, such as high-density polyethylene, cross-linked polystyrene, polytetrafluoroethylene and polycarbonate, are measured at room temperature. Their accuracies are justified by comparing the results with those obtained by other well-known techniques. An uncertainty analysis is also presented to estimate the errors resulting from the uncertainties in structure dimensions, resonant frequency, unloaded Q(0)-factor and conductivity of the metal plate. With this resonator, an accuracy of better than 1.5% is attained in real permittivity, while the uncertainty in loss tangent is within 2.5% for dielectric with loss tangent greater than 5.0 x 10(-4). For material with lower loss, e. g. tan delta similar to 10(-4), the measurement uncertainty in loss tangent would not be greater than 10%. This larger uncertainty in loss tangent for materials with lower loss is mainly due to the uncertainty in conductivity of the metal plate.

Noniterative and Stable Permittivity Extraction of Solid Dielectrics Using a New Formalism Based on Frequency-Domain and Time-Domain Analyses

Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements

A Fast and Efficient Method for Permittivity Measurement of Thin‐film Material

Retrieving Material Permittivity Under Oblique Incidence

Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

A Broadband Sensor for Permittivity Measurement of Solid, Crystal Grain and Powder Dielectrics in Microwave Range

Complex Permittivity Characterization of Low-Loss Dielectric Slabs at Sub-THz

An Automatic System for Complex Permittivity Measurement of LowLoss Materials at X Band

Far-field Characterization of Material Permittivity Based on Nonlinear Inversions

A complex permittivity measurement technique for high dielectric constant materials at microwave frequency

Measurement based on twice cavity perturbations for permittivity of dielectric thin films

Multifrequency Measurements of Dielectric Properties Using a Transmission-Type Overmoded Cylindrical Cavity

Broadband resonant calibration-free complex permittivity retrieval of liquid solutions

Simple, Fast, and Accurate Broadband Complex Permittivity Characterization Algorithm: Methodology and Experimental Validation from 140 GHz Up to 220 GHz

Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements

A Method to Determine Broadband Complex Permittivity of Thin Film Dielectric Materials up to 60 GHz

Free-Space Method for Measurement of Dielectric Properties at Microwave Frequencies

Microwave Measurement of Dielectric Properties Using the TM011and TE011modes Excited by a Generalized Nonradiative Dielectric Resonator

A Noniterative and Efficient Technique to Extract Complex Permittivity of Low-Loss Dielectric Materials at Terahertz Frequencies

High-Accuracy Wide-Range Measurement Method for Determination of Complex Permittivity in Reentrant Cavity: Part A --- Theoretical Analysis of the Method