Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

Ugur Cem Hasar,Yunus Kaya,Hamdullah Ozturk,Mucahit Izginli,Mehmet Ertugrul,Joaquim José Barroso,Omar M. Ramahi,Joaquim Jose Barroso
DOI: https://doi.org/10.1109/tim.2022.3153991
IF: 5.6
2022-01-01
IEEE Transactions on Instrumentation and Measurement
Abstract:A new deembedding technique is proposed for relative complex permittivity $\varepsilon _{r}$ determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free $\varepsilon _{r}$ due to gating process. The objective function derived to determine $\varepsilon _{r}$ by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibration-free and calibration-dependent methods in the literature.
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