Abstract:Journal Article From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging Get access Hua Guo, Hua Guo Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Liang Jin, Liang Jin Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Penghan Lu, Penghan Lu Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Zhangjie Wang, Zhangjie Wang Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Zhiwei Shan, Zhiwei Shan Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Benjamin Bammes, Benjamin Bammes Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Michael Spilman, Michael Spilman Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Robert Bilhorn Robert Bilhorn Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 343–344, https://doi.org/10.1017/S1431927615002512 Published: 23 September 2015

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