Holistic calibration method of deflectometry by holonomic framework priors

Wei Lang,Xiangchao Zhang,Yunuo Chen,Ting Chen,Xiangqian Jiang
DOI: https://doi.org/10.1364/ol.513949
IF: 3.6
2024-01-31
Optics Letters
Abstract:Wei Lang, Xiangchao Zhang, Yunuo Chen, Ting Chen, Xiangqian Jiang Phase measuring deflectometry is a powerful measurement tool of optical surfaces, but the measuring accuracy relies on the quality of ... [Opt. Lett. 49, 702-705 (2024)]
optics
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