The frequency dependent complex dielectric and electric modulus properties of Au/P3HT/n-Si (MPS) Schottky barrier diode (SBD)

Esra Yükseltürk,Seda Bengi
DOI: https://doi.org/10.1007/s10854-023-10983-w
2023-07-26
Abstract:The frequency dependent electrical and dielectric properties of the Au/P3HT/n-Si metal-polymer-semiconductor (MPS) type Schottky barrier diode (SBD) has been investigated using admittance-voltage ( C/G-V ) measurements over the range of 10 kHz–1 MHz at room temperature. Experimental results show that the values of both C and G/w decrease with increasing frequency confirming that the charges at interface can easily follow an ac signal and yield excess capacitance, especially, at low frequency. The frequency dependent dielectric constant ( ε′ ), dielectric loss ( ε′′ ), and loss tangent (tan δ ) are obtained using C and G/w data at various voltages. The ε′ and ε′′ values are found to be strongly dependent on both frequency and voltage, and their large values at low frequencies can be attributed to the excess polarization coming from charges at traps. The ac electrical conductivity ( σ ac ) tends to increase with both increasing frequency and voltage, as in the C-V and G-V values, indicating that both the interfacial polarization and surface states ( N ss ) are more effective at low frequencies and so yield an excess capacitance and conductance to the real value of them. Also, the electric modulus formalism of dielectric relaxation was studied to understand the nature of conductivity relaxation in P3HT. It was found that the frequency dependent real parts, M' and imaginary parts, M" , of the electric modulus strongly change with both frequency and voltages.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied
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