Abstract:Chemical state X-ray photoelectron spectroscopic analysis of first row transition metals and their oxides and hydroxides is challenging due to the complexity of their 2p spectra resulting from peak asymmetries, complex multiplet splitting, shake-up and plasmon loss structure, and uncertain, overlapping binding energies. Our previous paper [M.C. Biesinger et al., Appl. Surf. Sci. 257 (2010) 887–898.] in which we examined Sc, Ti, V, Cu and Zn species, has shown that all the values of the spectral fitting parameters for each specific species, i.e. binding energy (eV), full wide at half maximum (FWHM) value (eV) for each pass energy, spin–orbit splitting values and asymmetric peak shape fitting parameters, are not all normally provided in the literature and data bases, and are necessary for reproducible, quantitative chemical state analysis. A more consistent, practical and effective approach to curve fitting was developed based on a combination of (1) standard spectra from quality reference samples, (2) a survey of appropriate literature databases and/or a compilation of literature references and (3) specific literature references where fitting procedures are available. This paper extends this approach to the chemical states of Cr, Mn, Fe, Co and Ni metals, and various oxides and hydroxides where intense, complex multiplet splitting in many of the chemical states of these elements poses unique difficulties for chemical state analysis. The curve fitting procedures proposed use the same criteria as proposed previously but with the additional complexity of fitting of multiplet split spectra which has been done based on spectra of numerous reference materials and theoretical XPS modeling of these transition metal species. Binding energies, FWHM values, asymmetric peak shape fitting parameters, multiplet peak separation and peak area percentages are presented. The procedures developed can be utilized to remove uncertainties in the analysis of surface states in nano-particles, corrosion, catalysis and surface-engineered materials.

X‐ray standing wave assisted XANES for depth dependent chemical state analysis of Cr in Cr2O3/Cr bilayer structure

Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application

X-ray standing wave and reflectometric characterization of multilayer structures

Depth resolved chemical speciation of a superlattice structure

Identification of the surface features in the electronic structure of Cr

Atomic layer deposition of chromium oxide—An interplay between deposition and etching

Atomic structures and electronic properties of Cr-doped ZnO( ) surfaces

X-ray Diffraction Studies of Trilayer Oscillations in the Preferred Thickness of in Films on Si(111)

Near-surface analysis of magnetron sputtered AlCrNbYZrN x high entropy materials resolved by HAXPES

Monoatomic magnetic interfaces in IrMn/Cr/Co thin films probed by grazing incidence X-ray absorption spectroscopy

Characterization of Polycrystalline Gradient Thin Film by X-ray Diffraction Method

Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Cr, Mn, Fe, Co and Ni

Structure and Bonding in Amorphous Cr1-xCx Nanocomposite Thin Films: X-ray Absorption Spectra and First-Principles Calculation

Local structure of chromium incorporated into electrodeposited nickel hydroxide films.

In situ spectroscopic ellipsometry studies of trivalent chromium coating on aluminum

Atomic-level structural and chemical analysis of Cr-doped Bi2Se3 thin films

Direct View of Cr Atoms Doped in Anatase TiO2(001) Thin Film

Chemical States of Stainless Steel in nm to Several Tens of nm Region from Surface Observed by the Depth-Resolved X-ray Absorption Spectroscopy

Nondestructive Characterization of Thin Silicides Using X-Ray Reflectivity

Depth-graded Mo/Si multilayer coatings for hard x-rays

Surface‐Sensitive Detection of Magnetic Phase Transition in Van Der Waals Magnet CrSBr