Local structure of chromium incorporated into electrodeposited nickel hydroxide films.

C. Melendres,M. Balasubramanian
DOI: https://doi.org/10.1107/S0909049599000941
IF: 2.557
1999-05-01
Journal of Synchrotron Radiation
Abstract:We have utilized X-ray Absorption Fine Structure (XAFS) spectroscopy to investigate the local structure of Cr (III) and Cr (VI) ions incorporated into ot-Ni(OH)2 films. The films were prepared by cathodic co-deposition of Cr and Ni at a constant current from aqueous solutions of nickel nitrate, chromium nitrate and potassium chromate. XAFS measurements show that in films formed from 0.1 M Ni(NO3)2 + 0.0005 M Cr(NO3)3, Cr (III) is incorporated into the Ni lattice sites of ctNi(OH)2. In contrast, co-deposition from a 0.1 M Ni(NO3)2 + 0.001 M K2CrO4 solution results in Cr (VI) occupying the interlamellar sites of the brucite structure.
Chemistry,Physics,Medicine,Materials Science
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