Controlling dielectric properties of Nb+X (X = Al, Ga, Nb) co-doped and Nb-doped rutile-type TiO2 single crystals

Shota Kakimoto,Yujiro Hashimoto,Taro Kuwano,Koji Kimura,Manabu Hagiwara,Kazuhiko Deguchi,Hiroki Taniguchi,Koichi Hayashi
DOI: https://doi.org/10.1039/d2tc03914a
IF: 6.4
2022-12-17
Journal of Materials Chemistry C
Abstract:Dielectric measurements are performed in Nb+ X ( X = Al, Ga, In) co-doped and Nb-doped rutile-type TiO 2 single crystals before and after annealing in X 2 O 3 powders, with which an environment of the single crystals was controlled during the heat treatment. The apparently huge permittivity of the order of 10 5 are observed in all as-grown samples to indicate Maxwell-Wagner effect due to deterioration of their insulating property. Systematic analyses of dielectric relaxation observed in the as-grown samples at low-temperatures clarify that thermally excited carriers with the activation energy of several tens meV play a role in the Maxwell-Wagner effect. In the post-annealed samples, in contrast, the huge permittivity disappears, and the dielectric loss factor markedly decreases to indicate recovery of the insulating property. It has been discovered through x-ray fluorescence analyses that the insulation recovery stems from migration of X cations into the single crystal in the post-annealing, which are partially lost in the as-grown single crystal during synthesis. The post-annealing time dependence of dielectric properties indicates that minute control of Nb to X ratio is crucial to achieve the large permittivity and the fine insulating property simultaneously in the co-doped TiO 2 .
materials science, multidisciplinary,physics, applied
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