Nonlinear and low-loss tantalum pentoxide based micro-ring resonator by ion-assisted electron-beam deposition
Yi-Jen Chiu,Fu-Yan Yan,Jia-Wei Liu,Jia-Chi Lan,Te-Keng Wang,Chao-Hong Lin,Sung-Wen Huang Chen,Hao-Chung Kuo,Huai-Yung Wang,Chih-Hsien Cheng,Gong-Ru Lin,Min-Hsiung Shih,Yung-Jr Hung,Chao-Kuei Lee
DOI: https://doi.org/10.1364/osac.409853
2020-12-04
OSA Continuum
Abstract:Tantalum pentoxide (Ta 2 O 5 ) is a promising material for optical waveguide applications of photonics integration due to its excellent linear and nonlinear optical properties, such as high refractive index, large bandgap, and high nonlinearity. The quality of thin film deposition will then be critical for realizing optical waveguide devices and modules. In this work, an ion-assisted electron-beam evaporation system has been used to deposit such thin film. As low as 0.73 nm thickness roughness has been demonstrated in a 700 nm thick film, indicating it as a candidate for fabricating a low-loss waveguide. An optical waveguide-based ring resonator was made for examining the optical waveguide performance. Through the flat surface morphology, a low propagation loss of 1.4 dB/cm with an unloaded quality factor of 3 × 10 5 ring resonance has been realized. The nonlinear index of refraction (n 2 ) in as-deposited Ta 2 O 5 film was found to be in an order of magnitude of 10 −14 cm 2 /W, which was also confirmed by both Z-scan technique and all-optical modulation technique. By such high bandgap properties, a nonlinear absorption threshold of few TW/cm 2 was also observed for the first time. The measured device performances are comparable to the state-of-the-art results from up-to-date counterparts.