Light-output enhancement of InGaN light emitting diodes regrown on nanoporous distributed Bragg reflector substrates

John C. Jarman,Tongtong Zhu,Peter H. Griffin,Rachel A. Oliver
DOI: https://doi.org/10.7567/1347-4065/ab0cfd
IF: 1.5
2019-05-14
Japanese Journal of Applied Physics
Abstract:Utilising our novel wafer-scale electrochemical porosification approach which proceeds through thetop surface by means of nanoscale vertical etching pathways, we have prepared full 2 inch waferscontaining alternating solid GaN and nanoporous GaN (NP-GaN) layers that form distributed Braggreflectors (DBRs), and have regrown InGaN-based light emitting diode (LED) heterostructures on thesewafers. The NP-GaN DBR wafer is epi-ready and exhibits a peak reflectance of 95% at 420 nm prior togrowth of the LED heterostructure. We observe a 1.8× enhancement in peak intensity of LEDelectroluminescence from processed devices, and delayed onset of efficiency droop with increasedinjection current.
physics, applied
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