Radiative Efficiency and Charge‐Carrier Lifetimes and Diffusion Length in Polycrystalline CdSeTe Heterostructures

Darius Kuciauskas,John Moseley,Patrik Ščajev,David Albin
DOI: https://doi.org/10.1002/pssr.201900606
2019-12-05
Abstract:CdTe‐based photovoltaics is a rapidly developing energy technology with one of the lowest levelized costs of electricity. But nonradiative Shockley‐Read‐Hall (SRH) recombination limits the efficiency of CdTe solar cells. Partial mitigation of bulk and grain‐boundary SRH recombination was achieved by alloying CdTe with Se, and CdSexTe1‐x absorbers are used in high‐efficiency solar cells. Recently, interface recombination was significantly reduced with alumina passivation, but other properties of Al2O3/CdSexTe1−x/Al2O3 heterostructures have not yet been investigated. Here, we report further progress in understanding and developing polycrystalline heterostructures with x = 0.2. We show that external photoluminescence quantum yield is increased to 0.2%, quasi‐Fermi level splitting to 950 mV, minority‐carrier lifetimes to 750 ns, and mobility to 100 cm2/Vs. Such polycrystalline CdSexTe1−x electronic characteristics match or exceed CdTe single‐crystal properties. Resulting charge‐carrier diffusion length of ≈14 μm is several times greater than the absorber thickness in our test structures and in typical CdTe solar cells. With passivation and absorbers reported in this study, polycrystalline CdSeTe solar cell open‐circuit voltage can be increased from the current 76% of the Shockley‐Queisser limit to 82%, or close to 1 V.This article is protected by copyright. All rights reserved.
physics, condensed matter, applied,materials science, multidisciplinary
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