Free-carrier absorption in Be- and C-doped GaAs epilayers and far infrared detector applications

A. L. Korotkov,A. G. U. Perera,W. Z. Shen,J. Herfort,K. H. Ploog,W. J. Schaff,H. C. Liu
DOI: https://doi.org/10.1063/1.1347002
IF: 2.877
2001-03-15
Journal of Applied Physics
Abstract:Far infrared (FIR) absorption, reflection, and transmission in heavily doped p-GaAs multilayer structures have been measured for wavelengths 20–200 μm and compared with the calculated results. Both Be (in the range 3×1018–2.6×1019 cm−3) and C (1.8×1018–4.7×1019 cm−3)-doped structures were studied. It is found that the observed absorption, reflection, and transmission are explained correctly by the model with a dominant role of free-carrier absorption in highly doped regions. High reflection from heavily doped thick layers is attractive for the resonant cavity enhanced FIR detectors.
physics, applied
What problem does this paper attempt to address?