Power- and temperature-dependent photoluminescence investigation of carrier localization at inverted interface transitions in InAlAs/InP structures

Badreddine Smiri,Faouzi Saidi,Adnen Mlayah,Hassen Maaref
DOI: https://doi.org/10.7567/1347-4065/ab65a6
IF: 1.5
2020-01-24
Japanese Journal of Applied Physics
Abstract:We report on combined photoluminescence (PL) and micro-Raman microscopy to study the effect of theV/III flux ratio on InAlAs ternary alloy grown on (311)A InP by metal-organic chemical vapordeposition. The PL of the type-II transition was studied in a wide range of temperatures (10–300 K)and excitation intensities. As the V/III flux ratio increased from 25 to 125, a redshift of thetype-II transition was observed. Then, micro-Raman investigations showed the presence of an LO moderelated to LO-like InAs in InAsP alloy at the inverted interface in our samples. Furthermore, wediscuss the effect of laser excitation wavelength on the Raman spectrum. We also note that phononpeaks are very sensitive to different excitation sources (364 to 638 nm). At lower frequencies,disorder-activated longitudinal acoustic phonons are also observed, which consider the presence ofpotential fluctuations. This last generate the carrier's localization, which confirmed by PLmeasurements. In all s...
physics, applied
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