Selective Growth of GaP Crystals on CMOS-Compatible Si Nanotip Wafers by Gas Source Molecular Beam Epitaxy
Navid Kafi,Songdan Kang,Christian Golz,Adriana Rodrigues-Weisensee,Luca Persichetti,Diana Ryzhak,Giovanni Capellini,Davide Spirito,Martin Schmidbauer,Albert Kwasniewski,Carsten Netzel,Oliver Skibitzki,Fariba Hatami
DOI: https://doi.org/10.1021/acs.cgd.3c01337
IF: 4.01
2024-03-20
Crystal Growth & Design
Abstract:Gallium phosphide (GaP) is a III-V semiconductor with remarkable optoelectronic properties, and it has almost the same lattice constant as silicon (Si). However, to date, the monolithic and large-scale integration of GaP devices with silicon remains challenging. In this study, we present a nanoheteroepitaxy approach using gas-source molecular-beam epitaxy for selective growth of GaP islands on Si nanotips, which were fabricated using complementary metal-oxide semiconductor (CMOS) technology on a 200 mm n-type Si(001) wafer. Our results show that GaP islands with sizes on the order of hundreds of nanometers can be successfully grown on CMOS-compatible wafers. These islands exhibit a zinc-blende phase and possess optoelectronic properties similar to those of a high-quality epitaxial GaP layer. This result marks a notable advancement in the seamless integration of GaP-based devices with high scalability into Si nanotechnology and integrated optoelectronics.
chemistry, multidisciplinary,materials science,crystallography