Dual structural polysilicon BiFET-compatible surface micromachining module

B P van Drieënhuizen,J F L Goosen,Y X Li,M Bartek,P J French,P M Sarro,R F Wolffenbuttel
DOI: https://doi.org/10.1088/0960-1317/7/3/018
1997-09-01
Journal of Micromechanics and Microengineering
Abstract:A double structural polysilicon layer surface micromachining process compatible with a standard BiFET process has been designed and fully characterized. This process is to be used as a post-microelectronic process module and the overall process requires 17 masking steps. The thickness of the structural polysilicon is adjustable and the default values are a 3000 Å lower polysilicon layer and a 3000 Å nitride/3000 Å polysilicon upper structural layer. Special techniques are implemented to maintain the integrity of the microelectronic passivation and the interconnect during sacrificial etching. The layers are spaced 4000 Å apart using a PSG layer. High-performance microstructures have been fabricated after completion of the microelectronic process without degradation of the microelectronic devices.
engineering, electrical & electronic,nanoscience & nanotechnology,instruments & instrumentation,physics, applied
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