Yttria-stabilized zirconia thin film electrolyte deposited by EB-PVD on porous anode support for SOFC applications

Mohammad Tanhaei,Mozammel,Mahdi Mozammel
DOI: https://doi.org/10.1016/j.ceramint.2016.11.097
IF: 5.532
2017-02-01
Ceramics International
Abstract:Electron beam physical vapor deposition (EB-PVD) has been used to deposit thin film (YSZ) electrolytes on NiO-YSZ composite substrates pre-sintered at 1100°C, followed by further sintering at 1400°C in order to achieve dense films. Surface morphology of deposited layers has been investigated by AFM and FE-SEM. Increasing the deposition time and YSZ films thickness results in higher roughness and mean particle size of the thin film layer. FE-SEM observations of fresh fractured anodic half cells confirmed dense, crack-free, homogeneous and intensely adhered YSZ electrolyte layers. Sintering behavior of NiO and YSZ grains has been also investigated by the micrographs of cross sections of NiO-YSZ substrates.
materials science, ceramics
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