Low-temperature Ta-doped TiO x electron-selective contacts for high-performance silicon solar cells
Lijuan Zhang,Jiawang Qiu,Hao Cheng,Yuanyuan Zhang,Sihua Zhong,Linxing Shi,Haipeng Yin,Rui Tong,Zongyang Sun,Wenzhong Shen,Xiaomin Song,Zengguang Huang
DOI: https://doi.org/10.1016/j.solmat.2024.112703
IF: 6.9
2024-01-12
Solar Energy Materials and Solar Cells
Abstract:Carrier-selective contacts have been widely used to reduce the recombination losses of the minority carriers and boost the transport of the majority carriers at the contact regions for high-performance crystalline silicon solar cells. In this paper, the electron-selective Ta-doped TiO x (TTO) thin films with wide bandgap were prepared by means of low-temperature atomic layer deposition (ALD) technique. The systematic examinations were conducted on the interfacial structures , elemental analysis , passivation, and electrical performance of the TTO films. The results demonstrated that ALD TTO thin films possess better surface passivation ( τ eff = 355.31 μs, 130 °C annealing), and excellent electrical performance ( ρ c = 0.7 mΩ cm 2 , 200 °C annealing) on c-Si, in comparison to pure TiO x and TaO x films. Benefiting from these advantages, the optimized TTO based electron-selective contact solar cell achieved a high power conversion efficiency (PCE) of 21.58 %, reaching the cutting-edge level of the wide bandgap oxide based electron-selective contact solar cells. The low-temperature, low-energy-consumption and simple ALD TTO electron-selective contacts present a promising approach for Si-based high-efficiency solar cells.
materials science, multidisciplinary,physics, applied,energy & fuels