2Kv SiC Floating Island SBD with N+ Buffer

Ce Wang,Hengyu Wang,Qianqian Que,Miaoguang Bai,Yiding Wu,Haoyuan Cheng,Jiangbin Wan,Junze Li,Yanjun Li,Chi Zhang,Hongyi Xu,Na Ren,Qing Guo,Kuang Sheng
DOI: https://doi.org/10.1109/ispsd59661.2024.10579606
2024-01-01
Abstract:The Floating Island (FI) technology is a promising approach to break the 1D theoretical limit of the power semiconductor devices. However, the Floating Island is confronted with severe turn-on recovery problem due to residue charges in oppositely doped regions after blocking state. In this paper, a novel N+ Buffer is conceived as a solution to the turn-on recovery problem. The SiC Floating Island Schottky Barrier Diode with N+ Buffer (NB-FISBD) is experimentally fabricated and tested. It shows high static performance and effectively suppressed turn-on recovery problem. The NB-FISBD is expected to help the Floating Island devices unleash their potential in power electronic systems.
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