A 6.4-Gbps 0.41-Pj/b Fully-Digital Die-to-die Interconnect PHY for Silicon Interposer Based 2.5D Integration

Yinglin Yang,Yunzhengmao Wang,Tengyue Yi,Chixiao Chen,Qi Liu
DOI: https://doi.org/10.1016/j.vlsi.2024.102170
IF: 1.345
2024-01-01
Integration
Abstract:This work presents an agilely designed high-speed energy-efficient Die-to-Die interconnect PHY for silicon interposer based 2.5D integration. Due to the S-parameter of an interconnect is too complex for digital level analysis, a compact RC equivalent circuit model is discussed in this work. The model method works up-to 4 GHz, by comparing with the S-parameter results extracted by commercial 3D electromagnetic field solver. A termination-free die-to-die interconnect transceiver is proposed, where transmitters, receivers and clock modules are all implemented by standard cells, whose layout is generated by commercial digital physical EDA tools. A 28 nm prototype is developed and simulated. It maximally consumes 13.03 mW under 6.4-Gbps data, separately supplied by 0.8 V for logic and 0.5 V for TX drivers and RX front-ends. It achieves an power efficiency of 0.41 pJ/bit with 0.55-UI eye-diagram opening for 2.35 mm die-to-die distance, and the area of the layout in this work is only 686 μm2.
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