High-throughput predictions of two-dimensional dielectrics with first-principles calculations

Gege Du,Chunhui Li,Lei Shan,Long Cheng
DOI: https://doi.org/10.1103/PhysRevB.108.235409
IF: 3.7
2023-01-01
Physical Review B
Abstract:Two-dimensional (2D) dielectrics play a crucial role in the miniaturization of transistors. An optimal 2D dielectric should have a significant out-of-plane dielectric constant and appropriate band alignments to achieve superior performance. However, 2D materials generally exhibit poor out-of-plane dielectric constant. In this paper, we have identified 11 2D materials from the Computational 2D Materials Database with out-of-plane dielectric constants above 5.0, surpassing those of conventional dielectrics, i.e., SiO2, Al2O3, and BN. The band alignments show that ten monolayers SnNa2H6O6, GeLi2H6O6, HfNa2H6O6, ZrNa2H6O6, etc., are promising dielectrics when monolayer MoS2/WS2 serves as the channel. Moreover, four dielectrics have an out-of-plane di-electric constant that outperforms in-plane. This unusual feature indicates a stronger out-of-plane bond strength, resulting from the ionic bonds. We further provide a general guideline for quickly discovering high-performance dielectrics using structures and electronegativity tables.
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